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Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

Author

Listed:
  • Jonathan J. P. Peters

    (Trinity College Dublin, the University of Dublin
    Trinity College Dublin, the University of Dublin)

  • Tiarnan Mullarkey

    (Trinity College Dublin, the University of Dublin
    AMBER Centre)

  • Emma Hedley

    (University of Oxford)

  • Karin H. Müller

    (Imperial College London)

  • Alexandra Porter

    (Imperial College London)

  • Ali Mostaed

    (University of Oxford)

  • Lewys Jones

    (Trinity College Dublin, the University of Dublin
    Trinity College Dublin, the University of Dublin
    AMBER Centre)

Abstract

Transmission electron microscopy is a pivotal instrument in materials and biological sciences due to its ability to provide local structural and spectroscopic information on a wide range of materials. However, the electron detectors used in scanning transmission electron microscopy are often unable to provide quantified information, that is the number of electrons impacting the detector, without exhaustive calibration and processing. This results in arbitrary signal values with slow response times that cannot be used for quantification or comparison to simulations. Here we demonstrate and optimise a hardware signal processing approach to augment electron detectors to perform single electron counting.

Suggested Citation

  • Jonathan J. P. Peters & Tiarnan Mullarkey & Emma Hedley & Karin H. Müller & Alexandra Porter & Ali Mostaed & Lewys Jones, 2023. "Electron counting detectors in scanning transmission electron microscopy via hardware signal processing," Nature Communications, Nature, vol. 14(1), pages 1-9, December.
    • Handle: RePEc:nat:natcom:v:14:y:2023:i:1:d:10.1038_s41467-023-40875-w
    DOI: 10.1038/s41467-023-40875-w
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    References listed on IDEAS

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