Hawkes process-based technology impact analysis
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DOI: 10.1016/j.joi.2017.03.007
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- Chung, Park & Sohn, So Young, 2020. "Early detection of valuable patents using a deep learning model: Case of semiconductor industry," Technological Forecasting and Social Change, Elsevier, vol. 158(C).
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Keywords
Technology impact analysis; Hawkes processes; Future technological impact and uncertainty; Technology evolution and obsolescence; Patent citation forecasting;All these keywords.
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