Applicant and Examiner Citations in US Patents: An Overview and Analysis
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- Alcácer, Juan & Gittelman, Michelle & Sampat, Bhaven, 2009. "Applicant and examiner citations in U.S. patents: An overview and analysis," Research Policy, Elsevier, vol. 38(2), pages 415-427, March.
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Keywords
Technology; patents; patent examiners; prior art; citations;All these keywords.
NEP fields
This paper has been announced in the following NEP Reports:- NEP-INO-2008-09-29 (Innovation)
- NEP-IPR-2008-09-29 (Intellectual Property Rights)
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