Patent Quality: Towards a Systematic Framework for Analysis and Measurement
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- Higham, Kyle & de Rassenfosse, Gaétan & Jaffe, Adam B., 2021. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," Research Policy, Elsevier, vol. 50(4).
- Higham, Kyle & de Rassenfosse, Gaetan & Jaffe, Adam B, 2020. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," SocArXiv 49qxk, Center for Open Science.
- Kyle Higham & Gaetan de Rassenfosse & Adam Jaffe, 2021. "Patent quality: Towards a Systematic Framework for Analysis and Measurement," Working Papers 14, Chair of Science, Technology, and Innovation Policy.
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More about this item
JEL classification:
- O31 - Economic Development, Innovation, Technological Change, and Growth - - Innovation; Research and Development; Technological Change; Intellectual Property Rights - - - Innovation and Invention: Processes and Incentives
- O34 - Economic Development, Innovation, Technological Change, and Growth - - Innovation; Research and Development; Technological Change; Intellectual Property Rights - - - Intellectual Property and Intellectual Capital
NEP fields
This paper has been announced in the following NEP Reports:- NEP-CSE-2020-10-19 (Economics of Strategic Management)
- NEP-IPR-2020-10-19 (Intellectual Property Rights)
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