Conductive particle detection via efficient encoder–decoder network
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DOI: 10.1007/s10845-022-02024-w
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- Ruizhen Liu & Zhiyi Sun & Anhong Wang & Kai Yang & Yin Wang & Qianlai Sun, 2020. "Real-time defect detection network for polarizer based on deep learning," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1813-1823, December.
- Eryun Liu & Kangping Chen & Zhiyu Xiang & Jun Zhang, 2020. "Conductive particle detection via deep learning for ACF bonding in TFT-LCD manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 1037-1049, April.
- Maike Lorena Stern & Martin Schellenberger, 2021. "Fully convolutional networks for chip-wise defect detection employing photoluminescence images," Journal of Intelligent Manufacturing, Springer, vol. 32(1), pages 113-126, January.
- Olatomiwa Badmos & Andreas Kopp & Timo Bernthaler & Gerhard Schneider, 2020. "Image-based defect detection in lithium-ion battery electrode using convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 885-897, April.
- Domen Tabernik & Samo Šela & Jure Skvarč & Danijel Skočaj, 2020. "Segmentation-based deep-learning approach for surface-defect detection," Journal of Intelligent Manufacturing, Springer, vol. 31(3), pages 759-776, March.
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Keywords
Particle detection; Knowledge distillation; Light-weight neural networks; PAD-Net;All these keywords.
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