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Conductive particle detection via efficient encoder–decoder network

Author

Listed:
  • Yuanyuan Wang

    (Zhengzhou University
    Henan University of Engineering)

  • Ling Ma

    (Zhengzhou University)

  • Lihua Jian

    (Zhengzhou University)

  • Huiqin Jiang

    (Zhengzhou University)

Abstract

Particle detection aims to accurately locate and count valid particles in pad images to ensure the performance of electrical connections in the chip-on-glass (COG) process. However, existing methods fail to achieve both high detection accuracy and inference efficiency in real applications. To solve this problem, we design a computation-efficient particle detection network (PAD-Net) with an encoder–decoder architecture, making a good trade-off between inference efficiency and accuracy. In the encoder part, MobileNetV3 is tailored to greatly reduce parameters at a little cost of accuracy drop. And the decoder part is designed by using the light-weight RefineNet, which can further boost particle detection performance. Besides, the proposed network adopts the adaptive attention loss (termed AAL), which improves the detection accuracy with a negligible increase in computation cost. Finally, we employ a knowledge distillation strategy to further enhance the final detection performance without increasing the parameters and floating-point operations (FLOPs) of PAD-Net. Experimental results on the real datasets demonstrate that our methods can achieve high-accuracy and real-time detection performance on valid particles compared with the state-of-the-art methods.

Suggested Citation

  • Yuanyuan Wang & Ling Ma & Lihua Jian & Huiqin Jiang, 2023. "Conductive particle detection via efficient encoder–decoder network," Journal of Intelligent Manufacturing, Springer, vol. 34(8), pages 3563-3577, December.
  • Handle: RePEc:spr:joinma:v:34:y:2023:i:8:d:10.1007_s10845-022-02024-w
    DOI: 10.1007/s10845-022-02024-w
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    References listed on IDEAS

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    1. Ruizhen Liu & Zhiyi Sun & Anhong Wang & Kai Yang & Yin Wang & Qianlai Sun, 2020. "Real-time defect detection network for polarizer based on deep learning," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1813-1823, December.
    2. Eryun Liu & Kangping Chen & Zhiyu Xiang & Jun Zhang, 2020. "Conductive particle detection via deep learning for ACF bonding in TFT-LCD manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 1037-1049, April.
    3. Maike Lorena Stern & Martin Schellenberger, 2021. "Fully convolutional networks for chip-wise defect detection employing photoluminescence images," Journal of Intelligent Manufacturing, Springer, vol. 32(1), pages 113-126, January.
    4. Olatomiwa Badmos & Andreas Kopp & Timo Bernthaler & Gerhard Schneider, 2020. "Image-based defect detection in lithium-ion battery electrode using convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 885-897, April.
    5. Domen Tabernik & Samo Šela & Jure Skvarč & Danijel Skočaj, 2020. "Segmentation-based deep-learning approach for surface-defect detection," Journal of Intelligent Manufacturing, Springer, vol. 31(3), pages 759-776, March.
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