Serial number inspection for ceramic membranes via an end-to-end photometric-induced convolutional neural network framework
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DOI: 10.1007/s10845-020-01730-7
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- Hui Lin & Bin Li & Xinggang Wang & Yufeng Shu & Shuanglong Niu, 2019. "Automated defect inspection of LED chip using deep convolutional neural network," Journal of Intelligent Manufacturing, Springer, vol. 30(6), pages 2525-2534, August.
- Ohyung Kwon & Hyung Giun Kim & Min Ji Ham & Wonrae Kim & Gun-Hee Kim & Jae-Hyung Cho & Nam Il Kim & Kangil Kim, 2020. "A deep neural network for classification of melt-pool images in metal additive manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 31(2), pages 375-386, February.
- Olatomiwa Badmos & Andreas Kopp & Timo Bernthaler & Gerhard Schneider, 2020. "Image-based defect detection in lithium-ion battery electrode using convolutional neural networks," Journal of Intelligent Manufacturing, Springer, vol. 31(4), pages 885-897, April.
- Domen Tabernik & Samo Šela & Jure Skvarč & Danijel Skočaj, 2020. "Segmentation-based deep-learning approach for surface-defect detection," Journal of Intelligent Manufacturing, Springer, vol. 31(3), pages 759-776, March.
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Keywords
Convolutional neural network; End-to-end training and inspection; Photometric-induced; Serial numbers of ceramic membranes;All these keywords.
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