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Real-time defect detection network for polarizer based on deep learning

Author

Listed:
  • Ruizhen Liu

    (Taiyuan University of Science and Technology)

  • Zhiyi Sun

    (Taiyuan University of Science and Technology)

  • Anhong Wang

    (Taiyuan University of Science and Technology)

  • Kai Yang

    (Taiyuan University of Science and Technology)

  • Yin Wang

    (Taiyuan University of Science and Technology)

  • Qianlai Sun

    (Taiyuan University of Science and Technology)

Abstract

Quality analysis of the polarizer of a production line can be performed using image processing technology. The existing method of detecting defective images based on deep learning can ensure accurate classification; however, its detection speed is low, the model requires a large amount of memory, and it is difficult to meet the real-time requirements of online detection systems when hardware resources are limited. Therefore, in this study a lightweight polarizer defect detection network, called DDN, was developed based on deep learning. First, a parallel module was designed to build the network. This module has two main advantages. First, it mixes different convolution template sizes, and can fuse the features of different scales and extract more defect features than the traditional convolution layer. Second, depthwise separable convolution is used to replace full convolution in this module, which significantly reduces the number of parameters and the multiply-accumulate operations. Finally, a global average pooling (GAP) layer is used instead of a fully connected layer. The GAP layer has no parameters to optimize, which substantially reduces the number of network parameters. Experimental results show that the proposed method is better than existing methods in terms of classification speed, precision, and memory consumption for polarizer detection, and can satisfy real-time requirements.

Suggested Citation

  • Ruizhen Liu & Zhiyi Sun & Anhong Wang & Kai Yang & Yin Wang & Qianlai Sun, 2020. "Real-time defect detection network for polarizer based on deep learning," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1813-1823, December.
    • Handle: RePEc:spr:joinma:v:31:y:2020:i:8:d:10.1007_s10845-020-01536-7
    DOI: 10.1007/s10845-020-01536-7
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    References listed on IDEAS

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    1. Hui Lin & Bin Li & Xinggang Wang & Yufeng Shu & Shuanglong Niu, 2019. "Automated defect inspection of LED chip using deep convolutional neural network," Journal of Intelligent Manufacturing, Springer, vol. 30(6), pages 2525-2534, August.
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    Cited by:

    1. Yuanyuan Wang & Ling Ma & Lihua Jian & Huiqin Jiang, 2023. "Conductive particle detection via efficient encoder–decoder network," Journal of Intelligent Manufacturing, Springer, vol. 34(8), pages 3563-3577, December.
    2. Xinyu Suo & Jian Liu & Licheng Dong & Chen Shengfeng & Lu Enhui & Chen Ning, 2022. "A machine vision-based defect detection system for nuclear-fuel rod groove," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1649-1663, August.
    3. Zhuxi Ma & Yibo Li & Minghui Huang & Qianbin Huang & Jie Cheng & Si Tang, 2023. "Automated real-time detection of surface defects in manufacturing processes of aluminum alloy strip using a lightweight network architecture," Journal of Intelligent Manufacturing, Springer, vol. 34(5), pages 2431-2447, June.
    4. Danqing Kang & Jianhuang Lai & Junyong Zhu & Yu Han, 2023. "An adaptive feature reconstruction network for the precise segmentation of surface defects on printed circuit boards," Journal of Intelligent Manufacturing, Springer, vol. 34(7), pages 3197-3214, October.

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