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Global planning of accelerated degradation tests based on exponential dispersion degradation models

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  • I‐Chen Lee
  • Sheng‐Tsaing Tseng
  • Yili Hong

Abstract

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost‐constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi‐analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three‐level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost‐constrained ADT plan, compared with conventional optimal plans by grid search algorithms.

Suggested Citation

  • I‐Chen Lee & Sheng‐Tsaing Tseng & Yili Hong, 2020. "Global planning of accelerated degradation tests based on exponential dispersion degradation models," Naval Research Logistics (NRL), John Wiley & Sons, vol. 67(6), pages 469-483, September.
    • Handle: RePEc:wly:navres:v:67:y:2020:i:6:p:469-483
    DOI: 10.1002/nav.21923
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    References listed on IDEAS

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    1. Heonsang Lim & Bong-Jin Yum, 2011. "Optimal design of accelerated degradation tests based on Wiener process models," Journal of Applied Statistics, Taylor & Francis Journals, vol. 38(2), pages 309-325, September.
    2. Haitao Liao & Elsayed A. Elsayed, 2006. "Reliability inference for field conditions from accelerated degradation testing," Naval Research Logistics (NRL), John Wiley & Sons, vol. 53(6), pages 576-587, September.
    3. Chien‐Yu Peng, 2012. "A note on optimal allocations for the second elementary symmetric function with applications for optimal reliability design," Naval Research Logistics (NRL), John Wiley & Sons, vol. 59(3‐4), pages 278-284, April.
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    Cited by:

    1. Zhao, Xiujie & Chen, Piao & Lv, Shanshan & He, Zhen, 2023. "Reliability testing for product return prediction," European Journal of Operational Research, Elsevier, vol. 304(3), pages 1349-1363.
    2. Yan, Weian & Xu, Xiaofan & Bigaud, David & Cao, Wenqin, 2023. "Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process," Reliability Engineering and System Safety, Elsevier, vol. 230(C).

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