Reliability estimation from two types of accelerated testing data based on an artificial neural network supported Wiener process
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DOI: 10.1016/j.amc.2021.126757
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References listed on IDEAS
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Cited by:
- Xu, Qinqin & Zhu, Yuanguo, 2023. "Reliability analysis of uncertain random systems based on uncertain differential equation," Applied Mathematics and Computation, Elsevier, vol. 450(C).
- Zhang, Yadong & Zhang, Chao & Wang, Shaoping & Dui, Hongyan & Chen, Rentong, 2024. "Health indicators for remaining useful life prediction of complex systems based on long short-term memory network and improved particle filter," Reliability Engineering and System Safety, Elsevier, vol. 241(C).
- Levitin, Gregory & Xing, Liudong & Dai, Yuanshun, 2022. "Minimizing mission cost for production system with unreliable storage," Reliability Engineering and System Safety, Elsevier, vol. 227(C).
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Keywords
Accelerated life testing; Accelerated degradation testing; Artificial neural network; Wiener process; Bayesian inference;All these keywords.
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