A cost-driven reliability demonstration plan based on accelerated degradation tests
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DOI: 10.1016/j.ress.2018.11.017
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References listed on IDEAS
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Cited by:
- Starling, James K. & Mastrangelo, Christina & Choe, Youngjun, 2021. "Improving Weibull distribution estimation for generalized Type I censored data using modified SMOTE," Reliability Engineering and System Safety, Elsevier, vol. 211(C).
- Zheng, Huiling & Yang, Jun & Xu, Houbao & Zhao, Yu, 2023. "Reliability acceptance sampling plan for degraded products subject to Wiener process with unit heterogeneity," Reliability Engineering and System Safety, Elsevier, vol. 229(C).
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Keywords
Degradation model; Light-emitting diode (LED); Nonlinear random-coefficients model; Operating characteristic (OC) curve; Wiener process;All these keywords.
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