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Meta-FSDet: a meta-learning based detector for few-shot defects of photovoltaic modules

Author

Listed:
  • Shijie Wang

    (Hebei University of Technology)

  • Haiyong Chen

    (Hebei University of Technology)

  • Kun Liu

    (Hebei University of Technology)

  • Ying Zhou

    (Hebei University of Technology)

  • Huichuan Feng

    (Hebei University of Technology)

Abstract

In the initial stage of the establishment of photovoltaic (PV) module production lines or the upgrading of production processes, the available data for some defects are limited. The detection for these data-scarce defects of photovoltaic (PV) modules is a challenging task, because most detectors hardly extract meaningful high-level features from limited information of several samples. To address this challenge, this paper proposes a novel end-to-end meta-learning based few-shot detector (Meta-FSDet). Firstly, a prototype vector extractor (PVE) is proposed, which utilizes locational prior knowledge of data-scarce defects to extract corresponding prototype vectors. Then, a novel saliency highlighting network (SHN), which measures the similarity between extracted prototype vectors from PVE and each spatial-position vector of the query feature map, is proposed to infer a class-agnostic saliency map, in which the defective areas are well highlighted. Next, a remodel region proposal network (RRPN), which further leverages the saliency map from SHN to pixel-wisely reweight the inputted feature map of region proposal network (RPN), is presented to better infer meaningful high-level region-of-interest (RoI) features of data-scarce defects. Finally, these RoI features from RRPN are further processed by downstream classification and regression module to generate final prediction results. Extensive experiments on PV module dataset demonstrate our Meta-FSDet owns superior performance compared to other existing methods.

Suggested Citation

  • Shijie Wang & Haiyong Chen & Kun Liu & Ying Zhou & Huichuan Feng, 2023. "Meta-FSDet: a meta-learning based detector for few-shot defects of photovoltaic modules," Journal of Intelligent Manufacturing, Springer, vol. 34(8), pages 3413-3427, December.
  • Handle: RePEc:spr:joinma:v:34:y:2023:i:8:d:10.1007_s10845-022-02001-3
    DOI: 10.1007/s10845-022-02001-3
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    References listed on IDEAS

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    1. Akram, M. Waqar & Li, Guiqiang & Jin, Yi & Chen, Xiao & Zhu, Changan & Zhao, Xudong & Khaliq, Abdul & Faheem, M. & Ahmad, Ashfaq, 2019. "CNN based automatic detection of photovoltaic cell defects in electroluminescence images," Energy, Elsevier, vol. 189(C).
    2. Haiyong Chen & Yue Pang & Qidi Hu & Kun Liu, 2020. "Solar cell surface defect inspection based on multispectral convolutional neural network," Journal of Intelligent Manufacturing, Springer, vol. 31(2), pages 453-468, February.
    3. Yunhan Kim & Taekyum Kim & Byeng D. Youn & Sung-Hoon Ahn, 2022. "Machining quality monitoring (MQM) in laser-assisted micro-milling of glass using cutting force signals: an image-based deep transfer learning," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1813-1828, August.
    4. Chia-Yu Hsu & Ju-Chien Chien, 2022. "Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification," Journal of Intelligent Manufacturing, Springer, vol. 33(3), pages 831-844, March.
    5. Tae San Kim & Jong Wook Lee & Won Kyung Lee & So Young Sohn, 2022. "Novel method for detection of mixed-type defect patterns in wafer maps based on a single shot detector algorithm," Journal of Intelligent Manufacturing, Springer, vol. 33(6), pages 1715-1724, August.
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