Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
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DOI: 10.1016/j.ress.2016.06.002
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Cited by:
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- Hao, Songhua & Yang, Jun & Berenguer, Christophe, 2018. "Nonlinear step-stress accelerated degradation modelling considering three sources of variability," Reliability Engineering and System Safety, Elsevier, vol. 172(C), pages 207-215.
- Chen, Xingyu & Yang, Qingyu & Wu, Xin, 2022. "Nonlinear degradation model and reliability analysis by integrating image covariate," Reliability Engineering and System Safety, Elsevier, vol. 225(C).
- Chen, Wen-Bin & Li, Xiao-Yang & Wu, Ji-Peng & Kang, Rui, 2024. "Uncertain random accelerated degradation modelling and statistical analysis with aleatory and epistemic uncertainties from multiple dimensions," Reliability Engineering and System Safety, Elsevier, vol. 243(C).
- Li, Junxing & Wang, Zhihua & Zhang, Yongbo & Liu, Chengrui & Fu, Huimin, 2018. "A nonlinear Wiener process degradation model with autoregressive errors," Reliability Engineering and System Safety, Elsevier, vol. 173(C), pages 48-57.
- Li, Naipeng & Gebraeel, Nagi & Lei, Yaguo & Bian, Linkan & Si, Xiaosheng, 2019. "Remaining useful life prediction of machinery under time-varying operating conditions based on a two-factor state-space model," Reliability Engineering and System Safety, Elsevier, vol. 186(C), pages 88-100.
- Zhang, Zhengxin & Si, Xiaosheng & Hu, Changhua & Lei, Yaguo, 2018. "Degradation data analysis and remaining useful life estimation: A review on Wiener-process-based methods," European Journal of Operational Research, Elsevier, vol. 271(3), pages 775-796.
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Keywords
Accelerated test; Brownian motion; Degradation test; Light-emitting diodes; Step stress; Wiener process;All these keywords.
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