IDEAS home Printed from https://ideas.repec.org/a/eee/reensy/v163y2017icp14-21.html
   My bibliography  Save this article

A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation

Author

Listed:
  • Sun, Bo
  • Fan, Xuejun
  • Ye, Huaiyu
  • Fan, Jiajie
  • Qian, Cheng
  • van Driel, Williem
  • Zhang, Guoqi

Abstract

In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver’s degradations on lamp’s lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp’s lifetime in three different scenarios: Scenario 1 considers LED degradation only, Scenario 2 considers the driver degradation only, and Scenario 3 considers both degradations from LED and driver simultaneously. When these two degradations are both considered, the lamp’s lifetime is reduced by about 22% compared to the initial target of 25,000h. The results of Scenario 1 and 3 are close to each other. Scenario 2 gives erroneous results in terms of luminous flux as the LED’s degradation over time is not taken into consideration. This implies that LED’s degradation must be taken into considerations when LED and driver’s lifetimes are comparable.

Suggested Citation

  • Sun, Bo & Fan, Xuejun & Ye, Huaiyu & Fan, Jiajie & Qian, Cheng & van Driel, Williem & Zhang, Guoqi, 2017. "A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation," Reliability Engineering and System Safety, Elsevier, vol. 163(C), pages 14-21.
  • Handle: RePEc:eee:reensy:v:163:y:2017:i:c:p:14-21
    DOI: 10.1016/j.ress.2017.01.017
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0951832017301205
    Download Restriction: Full text for ScienceDirect subscribers only

    File URL: https://libkey.io/10.1016/j.ress.2017.01.017?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    References listed on IDEAS

    as
    1. Ding, Long & Wang, Hong & Kang, Kai & Wang, Kai, 2014. "A novel method for SIL verification based on system degradation using reliability block diagram," Reliability Engineering and System Safety, Elsevier, vol. 132(C), pages 36-45.
    2. Linkan Bian & Nagi Gebraeel, 2014. "Stochastic modeling and real-time prognostics for multi-component systems with degradation rate interactions," IISE Transactions, Taylor & Francis Journals, vol. 46(5), pages 470-482.
    3. Peng, Weiwen & Li, Yan-Feng & Yang, Yuan-Jian & Huang, Hong-Zhong & Zuo, Ming J., 2014. "Inverse Gaussian process models for degradation analysis: A Bayesian perspective," Reliability Engineering and System Safety, Elsevier, vol. 130(C), pages 175-189.
    4. Zhang, Chunhua & Lu, Xiang & Tan, Yuanyuan & Wang, Yashun, 2015. "Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing," Reliability Engineering and System Safety, Elsevier, vol. 142(C), pages 369-377.
    5. Fan, Jiajie & Yung, Kam-Chuen & Pecht, Michael, 2014. "Prognostics of lumen maintenance for High power white light emitting diodes using a nonlinear filter-based approach," Reliability Engineering and System Safety, Elsevier, vol. 123(C), pages 63-72.
    6. Zhi‐Sheng Ye & Min Xie, 2015. "Stochastic modelling and analysis of degradation for highly reliable products," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 31(1), pages 16-32, January.
    7. Ye, Zhi-Sheng & Chen, Nan & Shen, Yan, 2015. "A new class of Wiener process models for degradation analysis," Reliability Engineering and System Safety, Elsevier, vol. 139(C), pages 58-67.
    Full references (including those not matched with items on IDEAS)

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Yuan, Tao & Wu, Xinying & Bae, Suk Joo & Zhu, Xiaoyan, 2019. "Reliability assessment of a continuous-state fuel cell stack system with multiple degrading components," Reliability Engineering and System Safety, Elsevier, vol. 189(C), pages 157-164.
    2. Nina Sakinah Ahmad Rofaie & Seuk Wai Phoong & Muzalwana Abdul Talib @ Abdul Mutalib, 2022. "Light-Emitting Diode (LED) versus High-Pressure Sodium Vapour (HPSV) Efficiency: A Data Envelopment Analysis Approach with Undesirable Output," Energies, MDPI, vol. 15(13), pages 1-21, June.
    3. Sun, Bo & Fan, Xuejun & van Driel, Willem & Cui, Chengqiang & Zhang, Guoqi, 2018. "A stochastic process based reliability prediction method for LED driver," Reliability Engineering and System Safety, Elsevier, vol. 178(C), pages 140-146.
    4. Farzana Parveen Tajudeen & Noor Ismawati Jaafar & Ainin Sulaiman & Sedigheh Moghavvemi, 2020. "Light Emitting Diode (LED) Usage in Organizations: Impact on Environmental and Economic Performance," Sustainability, MDPI, vol. 12(20), pages 1-20, October.

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.
    1. Xudan Chen & Guoxun Ji & Xinli Sun & Zhen Li, 2019. "Inverse Gaussian–based model with measurement errors for degradation analysis," Journal of Risk and Reliability, , vol. 233(6), pages 1086-1098, December.
    2. Huang, Jianlin & Golubović, Dušan S & Koh, Sau & Yang, Daoguo & Li, Xiupeng & Fan, Xuejun & Zhang, G.Q., 2016. "Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test," Reliability Engineering and System Safety, Elsevier, vol. 154(C), pages 152-159.
    3. Wu, Fan & Niknam, Seyed A. & Kobza, John E., 2015. "A cost effective degradation-based maintenance strategy under imperfect repair," Reliability Engineering and System Safety, Elsevier, vol. 144(C), pages 234-243.
    4. Le Liu & Xiao-Yang Li & Enrico Zio & Rui Kang & Tong-Min Jiang, 2017. "Model Uncertainty in Accelerated Degradation Testing Analysis," Post-Print hal-01652218, HAL.
    5. Zhang, Zhengxin & Si, Xiaosheng & Hu, Changhua & Lei, Yaguo, 2018. "Degradation data analysis and remaining useful life estimation: A review on Wiener-process-based methods," European Journal of Operational Research, Elsevier, vol. 271(3), pages 775-796.
    6. Liu, Di & Wang, Shaoping & Zhang, Chao & Tomovic, Mileta, 2018. "Bayesian model averaging based reliability analysis method for monotonic degradation dataset based on inverse Gaussian process and Gamma process," Reliability Engineering and System Safety, Elsevier, vol. 180(C), pages 25-38.
    7. Wang, Huan & Wang, Guan-jun & Duan, Feng-jun, 2016. "Planning of step-stress accelerated degradation test based on the inverse Gaussian process," Reliability Engineering and System Safety, Elsevier, vol. 154(C), pages 97-105.
    8. Xu, Jun & Liang, Zhenglin & Li, Yan-Fu & Wang, Kaibo, 2021. "Generalized condition-based maintenance optimization for multi-component systems considering stochastic dependency and imperfect maintenance," Reliability Engineering and System Safety, Elsevier, vol. 211(C).
    9. Hao, Songhua & Yang, Jun & Berenguer, Christophe, 2019. "Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors," Reliability Engineering and System Safety, Elsevier, vol. 189(C), pages 261-270.
    10. Dong, Qinglai & Cui, Lirong, 2019. "A study on stochastic degradation process models under different types of failure Thresholds," Reliability Engineering and System Safety, Elsevier, vol. 181(C), pages 202-212.
    11. Hu, Jiawen & Chen, Piao, 2020. "Predictive maintenance of systems subject to hard failure based on proportional hazards model," Reliability Engineering and System Safety, Elsevier, vol. 196(C).
    12. Weichao Yu & Xianbin Zheng & Weihe Huang & Qingwen Cai & Jie Guo & Jili Xu & Yang Liu & Jing Gong & Hong Yang, 2022. "A Data-Driven Methodology for the Reliability Analysis of the Natural Gas Compressor Unit Considering Multiple Failure Modes," Energies, MDPI, vol. 15(10), pages 1-18, May.
    13. Zhengxin Zhang & Xiaosheng Si & Changhua Hu & Xiangyu Kong, 2015. "Degradation modeling–based remaining useful life estimation: A review on approaches for systems with heterogeneity," Journal of Risk and Reliability, , vol. 229(4), pages 343-355, August.
    14. Zhang, Jian-Xun & Si, Xiao-Sheng & Du, Dang-Bo & Hu, Chang-Hua & Hu, Chen, 2020. "A novel iterative approach of lifetime estimation for standby systems with deteriorating spare parts," Reliability Engineering and System Safety, Elsevier, vol. 201(C).
    15. Liu, Di & Wang, Shaoping, 2021. "An artificial neural network supported stochastic process for degradation modeling and prediction," Reliability Engineering and System Safety, Elsevier, vol. 214(C).
    16. Zhou, Shirong & Tang, Yincai & Xu, Ancha, 2021. "A generalized Wiener process with dependent degradation rate and volatility and time-varying mean-to-variance ratio," Reliability Engineering and System Safety, Elsevier, vol. 216(C).
    17. Wang, Xiaofei & Wang, Bing Xing & Jiang, Pei Hua & Hong, Yili, 2020. "Accurate reliability inference based on Wiener process with random effects for degradation data," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
    18. Alaswad, Suzan & Xiang, Yisha, 2017. "A review on condition-based maintenance optimization models for stochastically deteriorating system," Reliability Engineering and System Safety, Elsevier, vol. 157(C), pages 54-63.
    19. Liu, Bin & Liang, Zhenglin & Parlikad, Ajith Kumar & Xie, Min & Kuo, Way, 2017. "Condition-based maintenance for systems with aging and cumulative damage based on proportional hazards model," Reliability Engineering and System Safety, Elsevier, vol. 168(C), pages 200-209.
    20. Cheng, Yao & Liao, Haitao & Huang, Zhiyi, 2021. "Optimal degradation-based hybrid double-stage acceptance sampling plan for a heterogeneous product," Reliability Engineering and System Safety, Elsevier, vol. 210(C).

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:reensy:v:163:y:2017:i:c:p:14-21. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: https://www.journals.elsevier.com/reliability-engineering-and-system-safety .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.