Reliability demonstration based on accelerated degradation testing for unknown model parameters
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DOI: 10.1177/1748006X13477324
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References listed on IDEAS
- Siu-Keung Tse & Chunyan Yang, 2003. "Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 30(6), pages 709-718.
- Seo, J.H. & Jung, M. & Kim, C.M., 2009. "Design of accelerated life test sampling plans with a nonconstant shape parameter," European Journal of Operational Research, Elsevier, vol. 197(2), pages 659-666, September.
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- Luo, Wei & Zhang, Chun-hua & Chen, Xun & Tan, Yuan-yuan, 2015. "Accelerated reliability demonstration under competing failure modes," Reliability Engineering and System Safety, Elsevier, vol. 136(C), pages 75-84.
- Kim, Seong-Joon & Mun, Byeong Min & Bae, Suk Joo, 2019. "A cost-driven reliability demonstration plan based on accelerated degradation tests," Reliability Engineering and System Safety, Elsevier, vol. 183(C), pages 226-239.
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Keywords
Reliability demonstration; step-stress accelerated degradation testing; equivalent degradation criterion; accelerated degradation reliability demonstration test; accelerated life reliability demonstration test;All these keywords.
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