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Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring

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  • Min Kim
  • Bong-Jin Yum

Abstract

Type-I censored reliability acceptance sampling plans (RASPs) are developed for the Weibull lifetime distribution with unknown shape and scale parameters such that the producer and consumer risks are satisfied. It is assumed that the life test is conducted at an accelerated condition for which the acceleration factor (AF) is known, and each item is continuously monitored for failure. Sensitivity analyses are also conducted to assess the effect of the uncertainty in the assumed AF on the actual producer and consumer risks, and a method is developed for constructing RASPs that can accommodate the uncertainty in AF.

Suggested Citation

  • Min Kim & Bong-Jin Yum, 2009. "Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 36(1), pages 11-20.
    • Handle: RePEc:taf:japsta:v:36:y:2009:i:1:p:11-20
    DOI: 10.1080/02664760802382483
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    References listed on IDEAS

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    1. Uditha Balasooriya & Sutaip L. C. Saw, 1998. "Reliability sampling plans for the two-parameter exponential distribution under progressive censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(5), pages 707-714, June.
    2. Siu-Keung Tse & Chunyan Yang, 2003. "Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 30(6), pages 709-718.
    3. Dongchu Sun & James Berger, 1994. "Bayesian sequential reliability for Weibull and related distributions," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 46(2), pages 221-249, June.
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    Cited by:

    1. Jianyu Xu & Qingpei Hu & Dan Yu & Min Xie, 2017. "Reliability demonstration test for load-sharing systems with exponential and Weibull components," PLOS ONE, Public Library of Science, vol. 12(12), pages 1-19, December.
    2. Luo, Wei & Zhang, Chun-hua & Chen, Xun & Tan, Yuan-yuan, 2015. "Accelerated reliability demonstration under competing failure modes," Reliability Engineering and System Safety, Elsevier, vol. 136(C), pages 75-84.
    3. Cheng, Yao & Liao, Haitao & Huang, Zhiyi, 2021. "Optimal degradation-based hybrid double-stage acceptance sampling plan for a heterogeneous product," Reliability Engineering and System Safety, Elsevier, vol. 210(C).

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