Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals
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DOI: 10.1080/0266476032000053781
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References listed on IDEAS
- Uditha Balasooriya & Sutaip L. C. Saw, 1998. "Reliability sampling plans for the two-parameter exponential distribution under progressive censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(5), pages 707-714, June.
- Siu Keung Tse & Chunyan Yang & Hak-Keung Yuen, 2000. "Statistical analysis of Weibull distributed lifetime data under Type II progressive censoring with binomial removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 27(8), pages 1033-1043.
- Siu-Keung Tse & Hak-Keung Yuen, 1998. "Expected experiment times for the Weibull distribution under progressive censoring with random removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(1), pages 75-83.
- Uditha Balasooriya & Sutaip. L. C. Saw, 1999. "A note on approximate moments of progressively censored order statistics," Metron - International Journal of Statistics, Dipartimento di Statistica, ProbabilitĂ e Statistiche Applicate - University of Rome, vol. 0(1-2), pages 117-130.
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Cited by:
- Conghua Cheng & Jinyuan Chen & Jianming Bai, 2013. "Exact inferences of the two-parameter exponential distribution and Pareto distribution with censored data," Journal of Applied Statistics, Taylor & Francis Journals, vol. 40(7), pages 1464-1479, July.
- Luo, Wei & Zhang, Chun-hua & Chen, Xun & Tan, Yuan-yuan, 2015. "Accelerated reliability demonstration under competing failure modes," Reliability Engineering and System Safety, Elsevier, vol. 136(C), pages 75-84.
- Min Kim & Bong-Jin Yum, 2011. "Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring," Statistical Papers, Springer, vol. 52(2), pages 327-342, May.
- Min Kim & Bong-Jin Yum, 2009. "Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 36(1), pages 11-20.
- Wei Luo & Chun-Hua Zhang & Xun Chen & Yuan-Yuan Tan, 2013. "Reliability demonstration based on accelerated degradation testing for unknown model parameters," Journal of Risk and Reliability, , vol. 227(2), pages 162-172, April.
- Wu, Shuo-Jye & Huang, Syuan-Rong, 2012. "Progressively first-failure censored reliability sampling plans with cost constraint," Computational Statistics & Data Analysis, Elsevier, vol. 56(6), pages 2018-2030.
- Sukhdev Singh & Yogesh Tripathi, 2015. "Reliability sampling plans for a lognormal distribution under progressive first-failure censoring with cost constraint," Statistical Papers, Springer, vol. 56(3), pages 773-817, August.
- Maram Salem & Zeinab Amin & Moshira Ismail, 2020. "Progressively Censored Reliability Sampling Plans Based on Mean Product Lifetime," Sankhya B: The Indian Journal of Statistics, Springer;Indian Statistical Institute, vol. 82(1), pages 1-33, May.
- Mohamed Sief & Xinsheng Liu & Abd El-Raheem Mohamed Abd El-Raheem, 2024. "Inference for a constant-stress model under progressive type-II censored data from the truncated normal distribution," Computational Statistics, Springer, vol. 39(5), pages 2791-2820, July.
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