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Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring

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  • Min Kim
  • Bong-Jin Yum

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  • Min Kim & Bong-Jin Yum, 2011. "Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring," Statistical Papers, Springer, vol. 52(2), pages 327-342, May.
    • Handle: RePEc:spr:stpapr:v:52:y:2011:i:2:p:327-342
    DOI: 10.1007/s00362-009-0233-9
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    References listed on IDEAS

    as
    1. Siu-Keung Tse & Chunyan Yang, 2003. "Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 30(6), pages 709-718.
    2. Uditha Balasooriya & Sutaip L. C. Saw, 1998. "Reliability sampling plans for the two-parameter exponential distribution under progressive censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(5), pages 707-714, June.
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    Cited by:

    1. Manoj Rastogi & Yogesh Tripathi, 2013. "Inference on unknown parameters of a Burr distribution under hybrid censoring," Statistical Papers, Springer, vol. 54(3), pages 619-643, August.
    2. Muhammad Aslam & Chi-Hyuck Jun & Ashifa Arshad, 2015. "SkSP-V sampling plan for accelerated life tests," Journal of Risk and Reliability, , vol. 229(3), pages 193-199, June.
    3. Ji Hwan Cha & Maxim Finkelstein, 2023. "Acceptance reliability sampling plan for items from heterogeneous populations," Journal of Risk and Reliability, , vol. 237(6), pages 1199-1208, December.
    4. Cheng, Yao & Liao, Haitao & Huang, Zhiyi, 2021. "Optimal degradation-based hybrid double-stage acceptance sampling plan for a heterogeneous product," Reliability Engineering and System Safety, Elsevier, vol. 210(C).
    5. Sukhdev Singh & Yogesh Tripathi, 2015. "Reliability sampling plans for a lognormal distribution under progressive first-failure censoring with cost constraint," Statistical Papers, Springer, vol. 56(3), pages 773-817, August.
    6. Ji Hwan Cha & F. G. Badía, 2021. "Variables acceptance reliability sampling plan based on degradation test," Statistical Papers, Springer, vol. 62(5), pages 2227-2245, October.

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