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Environmental stress screening modelling, analysis and optimization

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  • Cha, Ji Hwan
  • Finkelstein, Maxim

Abstract

Environmental stress screening (ESS) is widely used in industry to eliminate early or latent failures. However, the appropriate stochastic modeling for ESS has not been yet suggested in the literature. In this paper, we develop the corresponding stochastic model and analyze the effect of the ESS in terms of population characteristics. In our model, during the ESS, the manufactured items are exposed to a stress with the relatively large magnitude, which can result either in immediate failures of items or in the increased susceptibility to future failures. The corresponding optimization problems for obtaining the optimal level of the stress magnitude are also formulated and discussed. An illustrative example is considered.

Suggested Citation

  • Cha, Ji Hwan & Finkelstein, Maxim, 2015. "Environmental stress screening modelling, analysis and optimization," Reliability Engineering and System Safety, Elsevier, vol. 139(C), pages 149-155.
    • Handle: RePEc:eee:reensy:v:139:y:2015:i:c:p:149-155
    DOI: 10.1016/j.ress.2015.03.003
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    References listed on IDEAS

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    1. Cha, Ji Hwan & Finkelstein, Maxim, 2010. "Burn-in by environmental shocks for two ordered subpopulations," European Journal of Operational Research, Elsevier, vol. 206(1), pages 111-117, October.
    2. Wu, Chin-Chun & Chou, Chao-Yu & Huang, Chikong, 2007. "Optimal burn-in time and warranty length under fully renewing combination free replacement and pro-rata warranty," Reliability Engineering and System Safety, Elsevier, vol. 92(7), pages 914-920.
    3. Kim, Kyungmee O., 2011. "Burn-in considering yield loss and reliability gain for integrated circuits," European Journal of Operational Research, Elsevier, vol. 212(2), pages 337-344, July.
    4. Maxim Finkelstein, 2008. "Failure Rate Modelling for Reliability and Risk," Springer Series in Reliability Engineering, Springer, number 978-1-84800-986-8, February.
    5. Kim, Kyungmee O. & Kuo, Way, 2009. "Optimal burn-in for maximizing reliability of repairable non-series systems," European Journal of Operational Research, Elsevier, vol. 193(1), pages 140-151, February.
    6. Jie Mi, 1996. "Minimizing Some Cost Functions Related to Both Burn-In and Field Use," Operations Research, INFORMS, vol. 44(3), pages 497-500, June.
    Full references (including those not matched with items on IDEAS)

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