Stochastic modeling of Random Access Memories reset transitions
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DOI: 10.1016/j.matcom.2018.11.016
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Cited by:
- Ruiz-Castro, Juan E. & Acal, Christian & Aguilera, Ana M. & Aguilera-Morillo, M. Carmen & Roldán, Juan B., 2021. "Linear-Phase-Type probability modelling of functional PCA with applications to resistive memories," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 186(C), pages 71-79.
- Christian Acal & Ana M. Aguilera & Manuel Escabias, 2020. "New Modeling Approaches Based on Varimax Rotation of Functional Principal Components," Mathematics, MDPI, vol. 8(11), pages 1-15, November.
- Juan E. Ruiz-Castro & Christian Acal & Ana M. Aguilera & Juan B. Roldán, 2021. "A Complex Model via Phase-Type Distributions to Study Random Telegraph Noise in Resistive Memories," Mathematics, MDPI, vol. 9(4), pages 1-16, February.
- Aguilera, Ana M. & Acal, Christian & Aguilera-Morillo, M. Carmen & Jiménez-Molinos, Francisco & Roldán, Juan B., 2021. "Homogeneity problem for basis expansion of functional data with applications to resistive memories," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 186(C), pages 41-51.
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Keywords
Functional data; Karhunen–Loève expansion; Penalized splines; Resistive switching; Resistive memories; Device variability;All these keywords.
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