Optimal average sample number of the SPRT chart for monitoring fraction nonconforming
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DOI: 10.1016/j.ejor.2013.03.026
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Cited by:
- Song, Zhi & Mukherjee, Amitava & Liu, Yanchun & Zhang, Jiujun, 2019. "Optimizing joint location-scale monitoring – An adaptive distribution-free approach with minimal loss of information," European Journal of Operational Research, Elsevier, vol. 274(3), pages 1019-1036.
- Bersimis, Sotiris & Koutras, Markos V. & Maravelakis, Petros E., 2014. "A compound control chart for monitoring and controlling high quality processes," European Journal of Operational Research, Elsevier, vol. 233(3), pages 595-603.
- Shi, Wen & Kleijnen, Jack P.C. & Liu, Zhixue, 2014.
"Factor screening for simulation with multiple responses: Sequential bifurcation,"
European Journal of Operational Research, Elsevier, vol. 237(1), pages 136-147.
- Shi, W. & Kleijnen, Jack P.C. & Liu, Zhixue, 2012. "Factor Screening for Simulation with Multiple Responses : Sequential Bifurcation," Other publications TiSEM 631ee82e-aff7-468c-838a-9, Tilburg University, School of Economics and Management.
- Shi, W. & Kleijnen, Jack P.C. & Liu, Zhixue, 2013. "Factor Screening For Simulation With Multiple Responses : Sequential Bifurcation," Other publications TiSEM 02d31acf-b6be-4c0f-beb7-5, Tilburg University, School of Economics and Management.
- Shi, W. & Kleijnen, Jack P.C. & Liu, Zhixue, 2013. "Factor Screening For Simulation With Multiple Responses : Sequential Bifurcation," Discussion Paper 2013-009, Tilburg University, Center for Economic Research.
- Shi, W. & Kleijnen, Jack P.C. & Liu, Zhixue, 2012. "Factor Screening for Simulation with Multiple Responses : Sequential Bifurcation," Discussion Paper 2012-032, Tilburg University, Center for Economic Research.
- Teoh, W.L. & Khoo, Michael B.C. & Castagliola, Philippe & Yeong, W.C. & Teh, S.Y., 2017. "Run-sum control charts for monitoring the coefficient of variation," European Journal of Operational Research, Elsevier, vol. 257(1), pages 144-158.
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Keywords
Sequential Probability Ratio Test (SPRT); Control chart; Average Sample Number (ASN); Average Number of Defectives (AND); Sampling interval;All these keywords.
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