A compound control chart for monitoring and controlling high quality processes
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DOI: 10.1016/j.ejor.2013.08.017
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Cited by:
- Song, Zhi & Mukherjee, Amitava & Liu, Yanchun & Zhang, Jiujun, 2019. "Optimizing joint location-scale monitoring – An adaptive distribution-free approach with minimal loss of information," European Journal of Operational Research, Elsevier, vol. 274(3), pages 1019-1036.
- Spiros D. Dafnis & Frosso S. Makri & Markos V. Koutras, 2021. "Generalizations of Runs and Patterns Distributions for Sequences of Binary Trials," Methodology and Computing in Applied Probability, Springer, vol. 23(1), pages 165-185, March.
- Moura Neto, F. & Souza, P. & de Magalhães, M.S., 2019. "Determining baseline profile by diffusion maps," European Journal of Operational Research, Elsevier, vol. 279(1), pages 107-123.
- Chang, Hsing-Ming & Chang, Yung-Ming & Fu, Winnie H.W. & Lee, Wan-Chen, 2018. "On limiting theorems for conditional causation probabilities of multiple-run-rules," Statistics & Probability Letters, Elsevier, vol. 138(C), pages 151-156.
- Lei Yong Lee & Michael Boon Chong Khoo & Sin Yin Teh & Ming Ha Lee, 2015. "A Variable Sampling Interval Synthetic Xbar Chart for the Process Mean," PLOS ONE, Public Library of Science, vol. 10(5), pages 1-18, May.
- Zhao, Xian & Wang, Xiaoyue & Sun, Ge, 2015. "Start-up demonstration tests with sparse connection," European Journal of Operational Research, Elsevier, vol. 243(3), pages 865-873.
- Teoh, W.L. & Khoo, Michael B.C. & Castagliola, Philippe & Yeong, W.C. & Teh, S.Y., 2017. "Run-sum control charts for monitoring the coefficient of variation," European Journal of Operational Research, Elsevier, vol. 257(1), pages 144-158.
- Nguyen, H.D. & Tran, K.P. & Tran, K.D., 2021. "The effect of measurement errors on the performance of the Exponentially Weighted Moving Average control charts for the Ratio of Two Normally Distributed Variables," European Journal of Operational Research, Elsevier, vol. 293(1), pages 203-218.
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Keywords
Quality control; Applied probability; High quality processes; Run length distribution; Markov chain impedance; Conforming run length;All these keywords.
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