EM algorithm for one-shot device testing under the exponential distribution
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DOI: 10.1016/j.csda.2011.09.010
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References listed on IDEAS
- Nandi, Swagata & Dewan, Isha, 2010. "An EM algorithm for estimating the parameters of bivariate Weibull distribution under random censoring," Computational Statistics & Data Analysis, Elsevier, vol. 54(6), pages 1559-1569, June.
- Ng, H. K. T. & Chan, P. S. & Balakrishnan, N., 2002. "Estimation of parameters from progressively censored data using EM algorithm," Computational Statistics & Data Analysis, Elsevier, vol. 39(4), pages 371-386, June.
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Cited by:
- Deepak Prajapati & Man Ho Ling & Ping Shing Chan & Debasis Kundu, 2023. "Misspecification of copula for one-shot devices under constant stress accelerated life-tests," Journal of Risk and Reliability, , vol. 237(4), pages 725-740, August.
- Yao Liu & Yashun Wang & Zhengwei Fan & Xun Chen & Chunhua Zhang & Yuanyuan Tan, 2020. "A new universal multi-stress acceleration model and multi-parameter estimation method based on particle swarm optimization," Journal of Risk and Reliability, , vol. 234(6), pages 764-778, December.
- Balakrishnan, N. & Ling, M.H., 2014. "Gamma lifetimes and one-shot device testing analysis," Reliability Engineering and System Safety, Elsevier, vol. 126(C), pages 54-64.
- Zhu, Xiaojun & Balakrishnan, N., 2022. "One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications," Reliability Engineering and System Safety, Elsevier, vol. 221(C).
- Balakrishnan, N. & So, H.Y. & Ling, M.H., 2015. "EM algorithm for one-shot device testing with competing risks under exponential distribution," Reliability Engineering and System Safety, Elsevier, vol. 137(C), pages 129-140.
- N. Balakrishnan & E. Castilla & N. Martín & L. Pardo, 2019. "Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 82(8), pages 991-1019, November.
- Zhu, Xiaojun & Liu, Kai & He, Mu & Balakrishnan, N., 2021. "Reliability estimation for one-shot devices under cyclic accelerated life-testing," Reliability Engineering and System Safety, Elsevier, vol. 212(C).
- D. Logothetis & S. Malefaki & S. Trevezas & P.-H. Cournède, 2022. "Bayesian Estimation for the GreenLab Plant Growth Model with Deterministic Organogenesis," Journal of Agricultural, Biological and Environmental Statistics, Springer;The International Biometric Society;American Statistical Association, vol. 27(1), pages 63-87, March.
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Keywords
EM algorithm; Bayesian method; One-shot device testing; Exponential distribution; Accelerated factor; Censoring;All these keywords.
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