Misspecification of copula for one-shot devices under constant stress accelerated life-tests
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DOI: 10.1177/1748006X221108850
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References listed on IDEAS
- Balakrishnan, N. & Ling, M.H., 2012. "EM algorithm for one-shot device testing under the exponential distribution," Computational Statistics & Data Analysis, Elsevier, vol. 56(3), pages 502-509.
- Chow, Gregory C., 1984. "Maximum-likelihood estimation of misspecified models," Economic Modelling, Elsevier, vol. 1(2), pages 134-138, April.
- M. H. Ling & P. S. Chan & H. K. T. Ng & N. Balakrishnan, 2021. "Copula models for one-shot device testing data with correlated failure modes," Communications in Statistics - Theory and Methods, Taylor & Francis Journals, vol. 50(16), pages 3875-3888, August.
- Fang, Guanqi & Pan, Rong & Hong, Yili, 2020. "Copula-based reliability analysis of degrading systems with dependent failures," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
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Keywords
Copula; constant-stress accelerated life testing; one-shot devices; quasi-maximum likelihood estimator; series and parallel systems;All these keywords.
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