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One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications

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  • Zhu, Xiaojun
  • Balakrishnan, N.

Abstract

A one-shot device, such as an automobile airbag, electro-explosive unit or munition, is a product that can be used only once. Its actual lifetime is unobservable, rendering the corresponding reliability analysis quite challenging. In this paper, two non-parametric methodologies—maximum likelihood estimation via EM-algorithm and Nelson–Aalen based estimation are developed for identical testing environment on one-shot devices. The EM-algorithm is usually used for unobserved failure times under some specific parametric models. But, here the EM-algorithm is adopted for the number of failures in each time interval in a non-parametric manner. Next, a semi-parametric approach, based on proportional hazards assumption, is developed for nonidentical testing environments, such as under an accelerated life-test. A Monte Carlo simulation study is then carried out for evaluating the performance of the inferential methods developed here. Finally, two data sets are analyzed for illustrative purpose.

Suggested Citation

  • Zhu, Xiaojun & Balakrishnan, N., 2022. "One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications," Reliability Engineering and System Safety, Elsevier, vol. 221(C).
    • Handle: RePEc:eee:reensy:v:221:y:2022:i:c:s0951832022000011
    DOI: 10.1016/j.ress.2022.108319
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