Automatic root cause analysis in manufacturing: an overview & conceptualization
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DOI: 10.1007/s10845-022-01914-3
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- Chen-Fu Chien & Chiao-Wen Liu & Shih-Chung Chuang, 2017. "Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement," International Journal of Production Research, Taylor & Francis Journals, vol. 55(17), pages 5095-5107, September.
- Hsu, Shao-Chung & Chien, Chen-Fu, 2007. "Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing," International Journal of Production Economics, Elsevier, vol. 107(1), pages 88-103, May.
- Felix Richter & Tetiana Aymelek & Dirk C. Mattfeld, 2017. "Automatic Root Cause Analysis by Integrating Heterogeneous Data Sources," Operations Research Proceedings, in: Karl Franz Dörner & Ivana Ljubic & Georg Pflug & Gernot Tragler (ed.), Operations Research Proceedings 2015, pages 469-474, Springer.
- Yanning Sun & Wei Qin & Zilong Zhuang & Hongwei Xu, 2021. "An adaptive fault detection and root-cause analysis scheme for complex industrial processes using moving window KPCA and information geometric causal inference," Journal of Intelligent Manufacturing, Springer, vol. 32(7), pages 2007-2021, October.
- Mingfeng Lin & Henry C. Lucas & Galit Shmueli, 2013. "Research Commentary ---Too Big to Fail: Large Samples and the p -Value Problem," Information Systems Research, INFORMS, vol. 24(4), pages 906-917, December.
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Keywords
Root cause analysis; Manufacturing; Fault diagnosis; Data mining; Machine learning;All these keywords.
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