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Determining the inspection intervals for one-shot systems with support equipment

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  • Zhao, Qian Qian
  • Yun, Won Young

Abstract

This paper considers systems that comprise one-shot devices and support equipment. One-shot devices are stored for long periods of time, and failures are detected only upon inspection. The support equipment needed to operate one-shot devices is maintained immediately upon failure. This paper addresses the inspection schedule problem for such systems with limited maintenance resources. The interval availability and life cycle cost are used as optimization criteria. The aim is to determine near-optimal inspection intervals for one-shot systems to minimize the expected life cycle cost and satisfy the target interval availability between inspection periods. An estimation of distribution algorithm (EDA) and a heuristic method are proposed to find the near-optimal solutions, and numerical examples are given to demonstrate the effects of the various model parameters to the near-optimal inspection intervals.

Suggested Citation

  • Zhao, Qian Qian & Yun, Won Young, 2018. "Determining the inspection intervals for one-shot systems with support equipment," Reliability Engineering and System Safety, Elsevier, vol. 169(C), pages 63-75.
    • Handle: RePEc:eee:reensy:v:169:y:2018:i:c:p:63-75
    DOI: 10.1016/j.ress.2017.08.007
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    References listed on IDEAS

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    1. Khac Tuan Huynh & Anne Barros & Christophe Bérenguer & Inma T. Castro, 2011. "A periodic inspection and replacement policy for systems subject to competing failure modes due to degradation and traumatic events," Post-Print hal-00790728, HAL.
    2. Huynh, K.T. & Barros, A. & Bérenguer, C. & Castro, I.T., 2011. "A periodic inspection and replacement policy for systems subject to competing failure modes due to degradation and traumatic events," Reliability Engineering and System Safety, Elsevier, vol. 96(4), pages 497-508.
    3. ten Wolde, Mike & Ghobbar, Adel A., 2013. "Optimizing inspection intervals—Reliability and availability in terms of a cost model: A case study on railway carriers," Reliability Engineering and System Safety, Elsevier, vol. 114(C), pages 137-147.
    4. Nakagawa, T. & Mizutani, S., 2009. "A summary of maintenance policies for a finite interval," Reliability Engineering and System Safety, Elsevier, vol. 94(1), pages 89-96.
    5. van der Weide, J.A.M. & Pandey, Mahesh D., 2015. "A stochastic alternating renewal process model for unavailability analysis of standby safety equipment," Reliability Engineering and System Safety, Elsevier, vol. 139(C), pages 97-104.
    6. Nakagawa, T. & Mizutani, S. & Chen, M., 2010. "A summary of periodic and random inspection policies," Reliability Engineering and System Safety, Elsevier, vol. 95(8), pages 906-911.
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    Citations

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    Cited by:

    1. Zhu, Xiaojun & Liu, Kai & He, Mu & Balakrishnan, N., 2021. "Reliability estimation for one-shot devices under cyclic accelerated life-testing," Reliability Engineering and System Safety, Elsevier, vol. 212(C).
    2. Wu, Shuo-Jye & Hsu, Chu-Chun & Huang, Syuan-Rong, 2020. "Optimal designs and reliability sampling plans for one-shot devices with cost considerations," Reliability Engineering and System Safety, Elsevier, vol. 197(C).
    3. Zhao, Qian Qian & Yun, Won Young, 2019. "Storage availability of one-shot system under periodic inspection considering inspection error," Reliability Engineering and System Safety, Elsevier, vol. 186(C), pages 120-133.
    4. Cheng, Dawei & Lu, Zhong & Zhou, Jia & Liang, Xihui, 2023. "An optimizing maintenance policy for airborne redundant systems operating with faults by using Markov process and NSGA-II," Reliability Engineering and System Safety, Elsevier, vol. 236(C).
    5. Alberti, A.R. & Neto, W.A. Ferreira & Cavalcante, C.A.V. & Santos, A.C.J., 2022. "Modelling a flexible two-phase inspection-maintenance policy for safety-critical systems considering revised and non-revised inspections," Reliability Engineering and System Safety, Elsevier, vol. 221(C).
    6. Zhu, Xiaojun & Balakrishnan, N., 2022. "One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications," Reliability Engineering and System Safety, Elsevier, vol. 221(C).

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