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Reliability modeling and optimization of operational use of one-shot units

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  • Cheng, Yao
  • Elsayed, Elsayed A.

Abstract

One-shot units are produced in batches and stored until use. While in storage, they are subjected to random non-destructive tests (NDTs) throughout their life horizon to determine their reliability metrics. Some of the one-shot units (with nonhomogeneous characteristics) are retrieved from storage and launched for operational use when needed. Referring to the launched units as a system, we optimize the system's operational use by determining the selected units’ characteristics and their launching order. The system reliability metrics are considered in the optimum selection and launching procedure. Considering the units’ inhomogeneity, we provide the confidence bounds of the probability that the system achieves a successful operation based on the optimal selection and launching order. A simulation model is developed to validate the proposed plan to optimize the units’ operational use.

Suggested Citation

  • Cheng, Yao & Elsayed, Elsayed A., 2018. "Reliability modeling and optimization of operational use of one-shot units," Reliability Engineering and System Safety, Elsevier, vol. 176(C), pages 27-36.
    • Handle: RePEc:eee:reensy:v:176:y:2018:i:c:p:27-36
    DOI: 10.1016/j.ress.2018.03.021
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    References listed on IDEAS

    as
    1. Cheng, Yao & Elsayed, Elsayed A., 2017. "Reliability modeling of mixtures of one-shot units under thermal cyclic stresses," Reliability Engineering and System Safety, Elsevier, vol. 167(C), pages 58-66.
    2. Wang, Zhaoqiang & Hu, Changhua & Wang, Wenbin & Zhou, Zhijie & Si, Xiaosheng, 2014. "A case study of remaining storage life prediction using stochastic filtering with the influence of condition monitoring," Reliability Engineering and System Safety, Elsevier, vol. 132(C), pages 186-195.
    3. Newby, Martin, 2008. "Monitoring and maintenance of spares and one shot devices," Reliability Engineering and System Safety, Elsevier, vol. 93(4), pages 588-594.
    4. Lu, Lixuan & Lewis, Gregory, 2008. "Configuration determination for k-out-of-n partially redundant systems," Reliability Engineering and System Safety, Elsevier, vol. 93(11), pages 1594-1604.
    5. D. Z. Du & F. K. Hwang, 1986. "Optimal Consecutive-2-Out-of- n Systems," Mathematics of Operations Research, INFORMS, vol. 11(1), pages 187-191, February.
    6. Hall, J. Brian & Mosleh, Ali, 2008. "An analytical framework for reliability growth of one-shot systems," Reliability Engineering and System Safety, Elsevier, vol. 93(11), pages 1751-1760.
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    Cited by:

    1. Wu, Shuo-Jye & Hsu, Chu-Chun & Huang, Syuan-Rong, 2020. "Optimal designs and reliability sampling plans for one-shot devices with cost considerations," Reliability Engineering and System Safety, Elsevier, vol. 197(C).
    2. Ling, M.H. & Hu, X.W., 2020. "Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
    3. Zhao, Qian Qian & Yun, Won Young, 2019. "Storage availability of one-shot system under periodic inspection considering inspection error," Reliability Engineering and System Safety, Elsevier, vol. 186(C), pages 120-133.
    4. Man-Ho Ling & Narayanaswamy Balakrishnan & Chenxi Yu & Hon Yiu So, 2021. "Inference for One-Shot Devices with Dependent k -Out-of- M Structured Components under Gamma Frailty," Mathematics, MDPI, vol. 9(23), pages 1-24, November.
    5. Zhu, Xiaojun & Balakrishnan, N., 2022. "One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications," Reliability Engineering and System Safety, Elsevier, vol. 221(C).

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