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Predicting system failure rates of SRAM-based FPGA on-board processors in space radiation environments

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  • Jung, Seunghwa
  • Choi, Jihwan P.

Abstract

Static random-access memory-based field-programmable gate arrays are increasingly being used for on-board processors in space missions. However, they are very susceptible to single event upsets that can generate on-board processor system malfunction or system failures in space radiation environments. This paper presents an on-board processor system adopting Triple Modular Redundancy with the concept of mitigation windows and external scrubber, and then suggests a mathematical model that predicts the on-board processor system failure rate by only using the information of system configuration resources. Our mathematical derivation can estimate on-board processor system reliability as a function of the single event upset rate, the number of mitigation windows, and on-board processor shield thickness. In addition, a guideline of the on-board processor system design is provided for achieving good single event upset mitigation capability and system reliability.

Suggested Citation

  • Jung, Seunghwa & Choi, Jihwan P., 2019. "Predicting system failure rates of SRAM-based FPGA on-board processors in space radiation environments," Reliability Engineering and System Safety, Elsevier, vol. 183(C), pages 374-386.
    • Handle: RePEc:eee:reensy:v:183:y:2019:i:c:p:374-386
    DOI: 10.1016/j.ress.2018.09.015
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    Cited by:

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    2. Zeng, Ying & Huang, Tudi & Li, Yan-Feng & Huang, Hong-Zhong, 2023. "Reliability modeling for power converter in satellite considering periodic phased mission," Reliability Engineering and System Safety, Elsevier, vol. 232(C).
    3. Chatterjee, Samrat & Thekdi, Shital, 2020. "An iterative learning and inference approach to managing dynamic cyber vulnerabilities of complex systems," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
    4. Yang, Shunkun & Shao, Qi & Bian, Chong, 2022. "Reliability analysis of ensemble fault tolerance for soft error mitigation against complex radiation effect," Reliability Engineering and System Safety, Elsevier, vol. 217(C).
    5. Jung, Sejin & Yoo, Junbeom & Lee, Young-Jun, 2020. "A practical application of NUREG/CR-6430 software safety hazard analysis to FPGA software," Reliability Engineering and System Safety, Elsevier, vol. 202(C).
    6. Ramezani, Reza & Clemente, Juan Antonio & Franco, Francisco J., 2020. "Analytical reliability estimation of SRAM-based FPGA designs against single-bit and multiple-cell upsets," Reliability Engineering and System Safety, Elsevier, vol. 202(C).

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