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Reliability growth by failure mode removal

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  • Gaver, Donald P.
  • Jacobs, Patricia A.

Abstract

Modern systems, civilian (e.g. automotive), and military (manned and unmanned aircraft, surface vehicles, submerged vessels), suffer initial design faults or failure modes (FMs), including software bugs, which detrimentally affect the system׳s reliability and availability. FMs must be removed or mitigated in impact during initial testing, including accelerated testing, in order for the system to meet its reliability requirements and operate satisfactorily in the field. This paper concerns models for reliability growth in which the behaviors of FMs are assumed independent, but of different types. Test effort is guided by prior information, expressed probabilistically, on the random number and tenacities of such FMs that are of various origins in the designs. Estimation of the numbers of FMs that will ultimately activate while in the field is considered here.

Suggested Citation

  • Gaver, Donald P. & Jacobs, Patricia A., 2014. "Reliability growth by failure mode removal," Reliability Engineering and System Safety, Elsevier, vol. 130(C), pages 27-32.
    • Handle: RePEc:eee:reensy:v:130:y:2014:i:c:p:27-32
    DOI: 10.1016/j.ress.2014.04.012
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    References listed on IDEAS

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    1. P. K. Kapur & H. Pham & A. Gupta & P. C. Jha, 2011. "Software Reliability Growth Models," Springer Series in Reliability Engineering, in: Software Reliability Assessment with OR Applications, chapter 0, pages 49-95, Springer.
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    7. Chiu, Kuei-Chen & Huang, Yeu-Shiang & Lee, Tzai-Zang, 2008. "A study of software reliability growth from the perspective of learning effects," Reliability Engineering and System Safety, Elsevier, vol. 93(10), pages 1410-1421.
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    Cited by:

    1. Peng, Yizhen & Wang, Yu & Zi, YanYang & Tsui, Kwok-Leung & Zhang, Chuhua, 2017. "Dynamic reliability assessment and prediction for repairable systems with interval-censored data," Reliability Engineering and System Safety, Elsevier, vol. 159(C), pages 301-309.
    2. Wei Wang & Yaofeng Xu & Liguo Hou, 2019. "Optimal allocation of test times for reliability growth testing with interval-valued model parameters," Journal of Risk and Reliability, , vol. 233(5), pages 791-802, October.

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