A perturbed gamma process with statistically dependent measurement errors
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DOI: 10.1016/j.ress.2016.03.024
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References listed on IDEAS
- Dongliang Lu & Mahesh D Pandey & Wei-Chau Xie, 2013. "An efficient method for the estimation of parameters of stochastic gamma process from noisy degradation measurements," Journal of Risk and Reliability, , vol. 227(4), pages 425-433, August.
- Kallen, M.J. & van Noortwijk, J.M., 2005. "Optimal maintenance decisions under imperfect inspection," Reliability Engineering and System Safety, Elsevier, vol. 90(2), pages 177-185.
- Rensheng Zhou & Nagi Gebraeel & Nicoleta Serban, 2012. "Degradation modeling and monitoring of truncated degradation signals," IISE Transactions, Taylor & Francis Journals, vol. 44(9), pages 793-803.
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Cited by:
- Xudan Chen & Guoxun Ji & Xinli Sun & Zhen Li, 2019. "Inverse Gaussian–based model with measurement errors for degradation analysis," Journal of Risk and Reliability, , vol. 233(6), pages 1086-1098, December.
- Liu, Xingheng & Matias, José & Jäschke, Johannes & Vatn, Jørn, 2022. "Gibbs sampler for noisy Transformed Gamma process: Inference and remaining useful life estimation," Reliability Engineering and System Safety, Elsevier, vol. 217(C).
- Hao, Songhua & Yang, Jun & Berenguer, Christophe, 2019. "Degradation analysis based on an extended inverse Gaussian process model with skew-normal random effects and measurement errors," Reliability Engineering and System Safety, Elsevier, vol. 189(C), pages 261-270.
- Duan, Fengjun & Wang, Guanjun, 2022. "Bayesian analysis for the transformed exponential dispersion process with random effects," Reliability Engineering and System Safety, Elsevier, vol. 217(C).
- Dong, Qinglai & Cui, Lirong, 2019. "A study on stochastic degradation process models under different types of failure Thresholds," Reliability Engineering and System Safety, Elsevier, vol. 181(C), pages 202-212.
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Keywords
Stochastic processes; Gamma process; Dependent measurement errors; Destructive tests; Monte Carlo integration method;All these keywords.
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