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Model-based clustering for integrated circuit yield enhancement

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  • Hwang, Jung Yoon
  • Kuo, Way

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  • Hwang, Jung Yoon & Kuo, Way, 2007. "Model-based clustering for integrated circuit yield enhancement," European Journal of Operational Research, Elsevier, vol. 178(1), pages 143-153, April.
    • Handle: RePEc:eee:ejores:v:178:y:2007:i:1:p:143-153
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    References listed on IDEAS

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    1. Celeux, Gilles & Govaert, Gerard, 1992. "A classification EM algorithm for clustering and two stochastic versions," Computational Statistics & Data Analysis, Elsevier, vol. 14(3), pages 315-332, October.
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    Cited by:

    1. Chia-Yu Hsu & Ju-Chien Chien, 2022. "Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification," Journal of Intelligent Manufacturing, Springer, vol. 33(3), pages 831-844, March.
    2. Yuan, Tao & Kuo, Way, 2008. "Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference," European Journal of Operational Research, Elsevier, vol. 190(1), pages 228-240, October.
    3. Haijun Li & Susan Xu & Way Kuo, 2014. "Asymptotic analysis of simultaneous damages in spatial Boolean models," Annals of Operations Research, Springer, vol. 212(1), pages 139-154, January.

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