IDEAS home Printed from https://ideas.repec.org/a/wly/navres/v53y2006i3p226-234.html
   My bibliography  Save this article

A stochastic model for burn‐in procedures in accelerated environment

Author

Listed:
  • Ji Hwan Cha

Abstract

Burn‐in procedure is a manufacturing technique that is intended to eliminate early failures of system or product. Burning‐in a component or system means to subject it to a period of use prior to being used in field. Generally, burn‐in is considered expensive and so the length of burn‐in is typically limited. Thus, burn‐in is most often accomplished in an accelerated environment in order to shorten the burn‐in process. A new failure rate model for an accelerated burn‐in procedure, which incorporates the accelerated ageing process induced by the accelerated environmental stress, is proposed. Under a more general assumption on the shape of failure rate function of products, which includes the traditional bathtub‐shaped failure rate function as a special case, upper bounds for optimal burn‐in time will be derived. A numerical example will also be given for illustration. © 2006 Wiley Periodicals, Inc. Naval Research Logistics, 2006

Suggested Citation

  • Ji Hwan Cha, 2006. "A stochastic model for burn‐in procedures in accelerated environment," Naval Research Logistics (NRL), John Wiley & Sons, vol. 53(3), pages 226-234, April.
  • Handle: RePEc:wly:navres:v:53:y:2006:i:3:p:226-234
    DOI: 10.1002/nav.20135
    as

    Download full text from publisher

    File URL: https://doi.org/10.1002/nav.20135
    Download Restriction: no

    File URL: https://libkey.io/10.1002/nav.20135?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    References listed on IDEAS

    as
    1. Henry W. Block & Thomas H. Savits & Harshinder Singh, 2002. "A Criterion for Burn-in that Balances Mean Residual Life and Residual Variance," Operations Research, INFORMS, vol. 50(2), pages 290-296, April.
    2. Jie Mi, 1996. "Minimizing Some Cost Functions Related to Both Burn-In and Field Use," Operations Research, INFORMS, vol. 44(3), pages 497-500, June.
    Full references (including those not matched with items on IDEAS)

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.
    1. Ji Cha & Maxim S. Finkelstein, 2009. "Stochastically ordered subpopulations and optimal burn-in procedure," MPIDR Working Papers WP-2009-030, Max Planck Institute for Demographic Research, Rostock, Germany.
    2. Ji Hwan Cha & Sangyeol Lee & Jie Mi, 2004. "Bounding the optimal burn‐in time for a system with two types of failure," Naval Research Logistics (NRL), John Wiley & Sons, vol. 51(8), pages 1090-1101, December.
    3. Cha, Ji Hwan & Pulcini, Gianpaolo, 2016. "Optimal burn-in procedure for mixed populations based on the device degradation process history," European Journal of Operational Research, Elsevier, vol. 251(3), pages 988-998.
    4. Cha, Ji Hwan & Finkelstein, Maxim, 2010. "Burn-in by environmental shocks for two ordered subpopulations," European Journal of Operational Research, Elsevier, vol. 206(1), pages 111-117, October.
    5. Henry W. Block & Thomas H. Savits & Harshinder Singh, 2002. "A Criterion for Burn-in that Balances Mean Residual Life and Residual Variance," Operations Research, INFORMS, vol. 50(2), pages 290-296, April.
    6. Sheu, Shey-Huei & Chien, Yu-Hung, 2005. "Optimal burn-in time to minimize the cost for general repairable products sold under warranty," European Journal of Operational Research, Elsevier, vol. 163(2), pages 445-461, June.
    7. M. Khorashadizadeh & A. Roknabadi & G. Borzadaran, 2013. "Variance residual life function based on double truncation," METRON, Springer;Sapienza Università di Roma, vol. 71(2), pages 175-188, September.
    8. Mohammadi, Faezeh & Izadi, Muhyiddin & Lai, Chin-Diew, 2016. "On testing whether burn-in is required under the long-run average cost," Statistics & Probability Letters, Elsevier, vol. 110(C), pages 217-224.
    9. Mark Bebbington & Chin-Diew Lai & Ričardas Zitikis, 2010. "Life expectancy of a bathtub shaped failure distribution," Statistical Papers, Springer, vol. 51(3), pages 599-612, September.
    10. E. Salehi & M. Asadi, 2012. "Results on the past lifetime of (n − k + 1)-out-of-n structures with nonidentical components," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 75(4), pages 439-454, May.
    11. Mark Bebbington & Chin-Diew Lai & Ričardas Zitikis, 2007. "Optimum Burn-in Time for a Bathtub Shaped Failure Distribution," Methodology and Computing in Applied Probability, Springer, vol. 9(1), pages 1-20, March.
    12. Jie Mi, 1999. "Comparisons of renewable warranties," Naval Research Logistics (NRL), John Wiley & Sons, vol. 46(1), pages 91-106, February.
    13. Cha, Ji Hwan & Finkelstein, Maxim, 2011. "Burn-in and the performance quality measures in heterogeneous populations," European Journal of Operational Research, Elsevier, vol. 210(2), pages 273-280, April.
    14. Ibrahim Elbatal & Emrah Altun & Ahmed Z. Afify & Gamze Ozel, 2019. "The Generalized Burr XII Power Series Distributions with Properties and Applications," Annals of Data Science, Springer, vol. 6(3), pages 571-597, September.
    15. J H Cha & M Finkelstein, 2012. "Burn-in via shocks for avoiding large risks," Journal of Risk and Reliability, , vol. 226(3), pages 318-326, June.
    16. Cha, Ji Hwan & Finkelstein, Maxim, 2015. "Environmental stress screening modelling, analysis and optimization," Reliability Engineering and System Safety, Elsevier, vol. 139(C), pages 149-155.
    17. Cha, Ji Hwan & Finkelstein, Maxim, 2013. "The failure rate dynamics in heterogeneous populations," Reliability Engineering and System Safety, Elsevier, vol. 112(C), pages 120-128.
    18. Zhi-Sheng Ye & Loon-Ching Tang & Min Xie, 2014. "Bi-objective burn-in modeling and optimization," Annals of Operations Research, Springer, vol. 212(1), pages 201-214, January.
    19. Kim, Kyungmee O., 2011. "Burn-in considering yield loss and reliability gain for integrated circuits," European Journal of Operational Research, Elsevier, vol. 212(2), pages 337-344, July.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wly:navres:v:53:y:2006:i:3:p:226-234. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Wiley Content Delivery (email available below). General contact details of provider: https://doi.org/10.1002/(ISSN)1520-6750 .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.