IDEAS home Printed from https://ideas.repec.org/a/sae/risrel/v229y2015i3p193-199.html
   My bibliography  Save this article

SkSP-V sampling plan for accelerated life tests

Author

Listed:
  • Muhammad Aslam
  • Chi-Hyuck Jun
  • Ashifa Arshad

Abstract

Here, we will develop a time-truncated skip-lot sampling plan (type V) for an accelerated life test. The lifetime of a product under the accelerated condition follows a Weibull distribution having the same shape parameter under the use condition but a new scale parameter adjusted by the acceleration factor. The plan parameters for the proposed sampling plan were found by satisfying the producer’s and the consumer’s risks. The performance of the proposed plan is compared with the existing single sampling plan for accelerated life testing. The proposed plan is more efficient than the existing plan in terms of the average sample number. The extensive tables are provided for the proposed plan so that industrial engineers can use the plan in practice.

Suggested Citation

  • Muhammad Aslam & Chi-Hyuck Jun & Ashifa Arshad, 2015. "SkSP-V sampling plan for accelerated life tests," Journal of Risk and Reliability, , vol. 229(3), pages 193-199, June.
    • Handle: RePEc:sae:risrel:v:229:y:2015:i:3:p:193-199
    DOI: 10.1177/1748006X15572499
    as

    Download full text from publisher

    File URL: https://journals.sagepub.com/doi/10.1177/1748006X15572499
    Download Restriction: no
    File URL: https://libkey.io/10.1177/1748006X15572499?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    References listed on IDEAS

    as
    1. S. Balamurali & Chi‐Hyuck Jun, 2011. "A new system of skip‐lot sampling plans having a provision for reducing normal inspection," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 27(3), pages 348-363, May.
    2. Min Kim & Bong-Jin Yum, 2011. "Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring," Statistical Papers, Springer, vol. 52(2), pages 327-342, May.
    Full references (including those not matched with items on IDEAS)

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.
    1. Ji Hwan Cha & Maxim Finkelstein, 2023. "Acceptance reliability sampling plan for items from heterogeneous populations," Journal of Risk and Reliability, , vol. 237(6), pages 1199-1208, December.
    2. Cheng, Yao & Liao, Haitao & Huang, Zhiyi, 2021. "Optimal degradation-based hybrid double-stage acceptance sampling plan for a heterogeneous product," Reliability Engineering and System Safety, Elsevier, vol. 210(C).
    3. Ji Hwan Cha & F. G. Badía, 2021. "Variables acceptance reliability sampling plan based on degradation test," Statistical Papers, Springer, vol. 62(5), pages 2227-2245, October.
    4. Sukhdev Singh & Yogesh Tripathi, 2015. "Reliability sampling plans for a lognormal distribution under progressive first-failure censoring with cost constraint," Statistical Papers, Springer, vol. 56(3), pages 773-817, August.
    5. Muhammad Aslam & Mohammed Albassam, 2019. "Inspection Plan Based on the Process Capability Index Using the Neutrosophic Statistical Method," Mathematics, MDPI, vol. 7(7), pages 1-10, July.
    6. Manoj Rastogi & Yogesh Tripathi, 2013. "Inference on unknown parameters of a Burr distribution under hybrid censoring," Statistical Papers, Springer, vol. 54(3), pages 619-643, August.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:sae:risrel:v:229:y:2015:i:3:p:193-199. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: SAGE Publications (email available below). General contact details of provider: .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.