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SkSP-V sampling plan for accelerated life tests

Author

Listed:
  • Muhammad Aslam
  • Chi-Hyuck Jun
  • Ashifa Arshad

Abstract

Here, we will develop a time-truncated skip-lot sampling plan (type V) for an accelerated life test. The lifetime of a product under the accelerated condition follows a Weibull distribution having the same shape parameter under the use condition but a new scale parameter adjusted by the acceleration factor. The plan parameters for the proposed sampling plan were found by satisfying the producer’s and the consumer’s risks. The performance of the proposed plan is compared with the existing single sampling plan for accelerated life testing. The proposed plan is more efficient than the existing plan in terms of the average sample number. The extensive tables are provided for the proposed plan so that industrial engineers can use the plan in practice.

Suggested Citation

  • Muhammad Aslam & Chi-Hyuck Jun & Ashifa Arshad, 2015. "SkSP-V sampling plan for accelerated life tests," Journal of Risk and Reliability, , vol. 229(3), pages 193-199, June.
    • Handle: RePEc:sae:risrel:v:229:y:2015:i:3:p:193-199
    DOI: 10.1177/1748006X15572499
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    References listed on IDEAS

    as
    1. S. Balamurali & Chi‐Hyuck Jun, 2011. "A new system of skip‐lot sampling plans having a provision for reducing normal inspection," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 27(3), pages 348-363, May.
    2. Min Kim & Bong-Jin Yum, 2011. "Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring," Statistical Papers, Springer, vol. 52(2), pages 327-342, May.
    Full references (including those not matched with items on IDEAS)

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