Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels
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DOI: 10.1007/s10845-020-01571-4
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- Jinho Kim & Youngmin Lee & Heeyoung Kim, 2018. "Detection and clustering of mixed-type defect patterns in wafer bin maps," IISE Transactions, Taylor & Francis Journals, vol. 50(2), pages 99-111, February.
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Keywords
Wafer bin map; Label uncertainty; Class label reconstruction; Unknown defect detection; Siamese network; G-means clustering;All these keywords.
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