IDEAS home Printed from https://ideas.repec.org/a/eee/reensy/v235y2023ics0951832022005695.html
   My bibliography  Save this article

Application of LSTM based on the BAT-MCS for binary-state network approximated time-dependent reliability problems

Author

Listed:
  • Yeh, Wei-Chang
  • Du, Chia-Ming
  • Tan, Shi-Yi
  • Forghani-elahabad, Majid

Abstract

Reliability is an important tool for evaluating the performance of modern networks. Currently, it is NP-hard and #P-hard to calculate the exact reliability of a binary-state network when the reliability of each component is assumed to be fixed. However, this assumption is unrealistic because the reliability of each component always varies with time. To meet this practical requirement, we propose a new algorithm called the binary-addition-tree algorithm and Monte Carlo simulation based Long Short-Term Memory (LSTM-BAT-MCS), based on long short-term memory (LSTM), the Monte Carlo simulation (MCS), and the binary-addition-tree algorithm (BAT). The superiority of the proposed LSTM-BAT-MCS was demonstrated by experimental results of three benchmark networks with at most 10−4 mean square error.

Suggested Citation

  • Yeh, Wei-Chang & Du, Chia-Ming & Tan, Shi-Yi & Forghani-elahabad, Majid, 2023. "Application of LSTM based on the BAT-MCS for binary-state network approximated time-dependent reliability problems," Reliability Engineering and System Safety, Elsevier, vol. 235(C).
    • Handle: RePEc:eee:reensy:v:235:y:2023:i:c:s0951832022005695
    DOI: 10.1016/j.ress.2022.108954
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0951832022005695
    Download Restriction: Full text for ScienceDirect subscribers only
    File URL: https://libkey.io/10.1016/j.ress.2022.108954?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    References listed on IDEAS

    as
    1. Yeh, Wei-Chang & Tan, Shi-Yi & Zhu, Wenbo & Huang, Chia-Ling & Yang, Guang-yi, 2022. "Novel binary addition tree algorithm (BAT) for calculating the direct lower-bound of the highly reliable binary-state network reliability," Reliability Engineering and System Safety, Elsevier, vol. 223(C).
    2. Yeh, Wei-Chang & Hao, Zhifeng & Forghani-elahabad, Majid & Wang, Gai-Ge & Lin, Yih-Lon, 2021. "Novel Binary-Addition Tree Algorithm for Reliability Evaluation of Acyclic Multistate Information Networks," Reliability Engineering and System Safety, Elsevier, vol. 210(C).
    3. Roubos, Alfred A. & Allaix, Diego L. & Schweckendiek, Timo & Steenbergen, Raphael D.J.M. & Jonkman, Sebastiaan N., 2020. "Time-dependent reliability analysis of service-proven quay walls subject to corrosion-induced degradation," Reliability Engineering and System Safety, Elsevier, vol. 203(C).
    4. Kakadia, Deepak & Ramirez-Marquez, Dr. Jose Emmanuel, 2020. "Quantitative approaches for optimization of user experience based on network resilience for wireless service provider networks," Reliability Engineering and System Safety, Elsevier, vol. 193(C).
    5. Yeh, Wei-Chang, 2021. "Novel Algorithm for Computing All-Pairs Homogeneity-Arc Binary-State Undirected Network Reliability," Reliability Engineering and System Safety, Elsevier, vol. 216(C).
    6. Yeh, Wei-Chang & Tan, Shi-Yi & Forghani-elahabad, Majid & Khadiri, Mohamed El & Jiang, Yunzhi & Lin, Chen-Shiun, 2022. "New binary-addition tree algorithm for the all-multiterminal binary-state network reliability problem," Reliability Engineering and System Safety, Elsevier, vol. 224(C).
    7. Enrico Zio & Nicola Pedroni, 2010. "Reliability Estimation by Advanced Monte Carlo Simulation," Springer Series in Reliability Engineering, in: Javier Faulin & Angel A. Juan & Sebastián Martorell & José-Emmanuel Ramírez-Márquez (ed.), Simulation Methods for Reliability and Availability of Complex Systems, chapter 0, pages 3-39, Springer.
    8. Yeh, Wei-Chang, 2006. "A simple algorithm to search for all MCs in networks," European Journal of Operational Research, Elsevier, vol. 174(3), pages 1694-1705, November.
    9. Yeh, Wei-Chang, 2021. "Novel binary-addition tree algorithm (BAT) for binary-state network reliability problem," Reliability Engineering and System Safety, Elsevier, vol. 208(C).
    10. Yeh, Wei-Chang & Bae, Changseok & Huang, Chia-Ling, 2015. "A new cut-based algorithm for the multi-state flow network reliability problem," Reliability Engineering and System Safety, Elsevier, vol. 136(C), pages 1-7.
    11. Yeh, Wei-Chang, 2021. "A quick BAT for evaluating the reliability of binary-state networks," Reliability Engineering and System Safety, Elsevier, vol. 216(C).
    12. Wenjie Lu & Jiazheng Li & Yifan Li & Aijun Sun & Jingyang Wang, 2020. "A CNN-LSTM-Based Model to Forecast Stock Prices," Complexity, Hindawi, vol. 2020, pages 1-10, November.
    13. Gregory Levitin, 2005. "The Universal Generating Function in Reliability Analysis and Optimization," Springer Series in Reliability Engineering, Springer, number 978-1-84628-245-4, March.
    14. Wei-Chang Yeh & Edward Lin & Chia-Ling Huang & Luxing Yang, 2021. "Predicting Spread Probability of Learning-Effect Computer Virus," Complexity, Hindawi, vol. 2021, pages 1-17, July.
    15. Li, Mingyang & Wang, Zequn, 2022. "LSTM-augmented deep networks for time-variant reliability assessment of dynamic systems," Reliability Engineering and System Safety, Elsevier, vol. 217(C).
    16. Francesco, Di Maio & Matteo, Fumagalli & Carlo, Guerini & Federico, Perotti & Enrico, Zio, 2021. "Time-dependent reliability analysis of the reactor building of a nuclear power plant for accounting of its aging and degradation," Reliability Engineering and System Safety, Elsevier, vol. 205(C).
    Full references (including those not matched with items on IDEAS)

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Ouyang, Linhan & Che, Yushuai & Park, Chanseok & Chen, Yuejian, 2024. "A novel active learning Gaussian process modeling-based method for time-dependent reliability analysis considering mixed variables," Reliability Engineering and System Safety, Elsevier, vol. 244(C).
    2. Yeh, Wei-Chang, 2024. "A new hybrid inequality BAT for comprehensive all-level d-MP identification using minimal paths in Multistate Flow Network reliability analysis," Reliability Engineering and System Safety, Elsevier, vol. 244(C).

    Most related items

    These are the items that most often cite the same works as this one and are cited by the same works as this one.
    1. Yeh, Wei-Chang & Tan, Shi-Yi & Zhu, Wenbo & Huang, Chia-Ling & Yang, Guang-yi, 2022. "Novel binary addition tree algorithm (BAT) for calculating the direct lower-bound of the highly reliable binary-state network reliability," Reliability Engineering and System Safety, Elsevier, vol. 223(C).
    2. Yeh, Wei-Chang, 2022. "Novel direct algorithm for computing simultaneous all-level reliability of multistate flow networks," Reliability Engineering and System Safety, Elsevier, vol. 225(C).
    3. Yeh, Wei-Chang, 2022. "Novel self-adaptive Monte Carlo simulation based on binary-addition-tree algorithm for binary-state network reliability approximation," Reliability Engineering and System Safety, Elsevier, vol. 228(C).
    4. Yeh, Wei-Chang & Tan, Shi-Yi & Forghani-elahabad, Majid & Khadiri, Mohamed El & Jiang, Yunzhi & Lin, Chen-Shiun, 2022. "New binary-addition tree algorithm for the all-multiterminal binary-state network reliability problem," Reliability Engineering and System Safety, Elsevier, vol. 224(C).
    5. Yeh, Wei-Chang, 2021. "Novel Algorithm for Computing All-Pairs Homogeneity-Arc Binary-State Undirected Network Reliability," Reliability Engineering and System Safety, Elsevier, vol. 216(C).
    6. Yeh, Wei-Chang, 2021. "A quick BAT for evaluating the reliability of binary-state networks," Reliability Engineering and System Safety, Elsevier, vol. 216(C).
    7. Yeh, Wei-Chang, 2024. "A new hybrid inequality BAT for comprehensive all-level d-MP identification using minimal paths in Multistate Flow Network reliability analysis," Reliability Engineering and System Safety, Elsevier, vol. 244(C).
    8. Yeh, Wei-Chang, 2021. "Novel binary-addition tree algorithm (BAT) for binary-state network reliability problem," Reliability Engineering and System Safety, Elsevier, vol. 208(C).
    9. Yeh, Wei-Chang, 2023. "QB-II for evaluating the reliability of binary-state networks," Reliability Engineering and System Safety, Elsevier, vol. 230(C).
    10. Yeh, Wei-Chang & Zhu, Wenbo & Tan, Shi-Yi & Wang, Gai-Ge & Yeh, Yuan-Hui, 2022. "Novel general active reliability redundancy allocation problems and algorithm," Reliability Engineering and System Safety, Elsevier, vol. 218(PA).
    11. Wu, Baichao & Sun, Long, 2024. "A novel layer-by-layer recursive decomposition algorithm for calculation of network reliability," Reliability Engineering and System Safety, Elsevier, vol. 244(C).
    12. Hao, Zhifeng & Yeh, Wei-Chang & Tan, Shi-Yi, 2021. "One-batch preempt deterioration-effect multi-state multi-rework network reliability problem and algorithms," Reliability Engineering and System Safety, Elsevier, vol. 215(C).
    13. Chen, Liwei & Cheng, Chunchun & Dui, Hongyan & Xing, Liudong, 2022. "Maintenance cost-based importance analysis under different maintenance strategies," Reliability Engineering and System Safety, Elsevier, vol. 222(C).
    14. Davila-Frias, Alex & Yodo, Nita & Le, Trung & Yadav, Om Prakash, 2023. "A deep neural network and Bayesian method based framework for all-terminal network reliability estimation considering degradation," Reliability Engineering and System Safety, Elsevier, vol. 229(C).
    15. Yeh, Wei-Chang, 2024. "Time-reliability optimization for the stochastic traveling salesman problem," Reliability Engineering and System Safety, Elsevier, vol. 248(C).
    16. Cui, Hongjun & Wang, Fei & Ma, Xinwei & Zhu, Minqing, 2022. "A novel fixed-node unconnected subgraph method for calculating the reliability of binary-state networks," Reliability Engineering and System Safety, Elsevier, vol. 226(C).
    17. Yeh, Wei-Chang, 2020. "A new method for verifying d-MC candidates," Reliability Engineering and System Safety, Elsevier, vol. 204(C).
    18. Yeh, Wei-Chang, 2023. "Novel recursive inclusion-exclusion technology based on BAT and MPs for heterogeneous-arc binary-state network reliability problems," Reliability Engineering and System Safety, Elsevier, vol. 231(C).
    19. Niu, Yi-Feng & Gao, Zi-You & Lam, William H.K., 2017. "A new efficient algorithm for finding all d-minimal cuts in multi-state networks," Reliability Engineering and System Safety, Elsevier, vol. 166(C), pages 151-163.
    20. Kozyra, Paweł Marcin, 2023. "The usefulness of (d,b)-MCs and (d,b)-MPs in network reliability evaluation under delivery or maintenance cost constraints," Reliability Engineering and System Safety, Elsevier, vol. 234(C).

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:reensy:v:235:y:2023:i:c:s0951832022005695. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    If CitEc recognized a bibliographic reference but did not link an item in RePEc to it, you can help with this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: https://www.journals.elsevier.com/reliability-engineering-and-system-safety .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.