Statistical identification guided open-set domain adaptation in fault diagnosis
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DOI: 10.1016/j.ress.2022.109047
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References listed on IDEAS
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Cited by:
- Liu, Jianing & Cao, Hongrui & Luo, Yang, 2023. "An information-induced fault diagnosis framework generalizing from stationary to unknown nonstationary working conditions," Reliability Engineering and System Safety, Elsevier, vol. 237(C).
- Zhao, Zeyun & Wang, Jia & Tao, Qian & Li, Andong & Chen, Yiyang, 2024. "An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis," Reliability Engineering and System Safety, Elsevier, vol. 244(C).
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Keywords
Open-set domain adaptation; Unknown-class identification; Extreme value theory (EVT); Fault diagnosis;All these keywords.
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