A change-point based reliability prediction model using field return data
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DOI: 10.1016/j.ress.2016.07.024
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References listed on IDEAS
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Cited by:
- Pan, Xing & Wang, Huixiong & You, Weijia & Zhang, Manli & Yang, Yuexiang, 2020. "Assessing the reliability of electronic products using customer knowledge discovery," Reliability Engineering and System Safety, Elsevier, vol. 199(C).
- Zhang, Jian-Xun & Hu, Chang-Hua & He, Xiao & Si, Xiao-Sheng & Liu, Yang & Zhou, Dong-Hua, 2017. "Lifetime prognostics for deteriorating systems with time-varying random jumps," Reliability Engineering and System Safety, Elsevier, vol. 167(C), pages 338-350.
- Gupta, Sanjib Kumar & Bhattacharya, Debasis, 2022. "Non-parametric estimation of bivariate reliability from incomplete two-dimensional warranty data," Reliability Engineering and System Safety, Elsevier, vol. 222(C).
- Lin, Kunsong & Chen, Yunxia, 2021. "Analysis of two-dimensional warranty data considering global and local dependence of heterogeneous marginals," Reliability Engineering and System Safety, Elsevier, vol. 207(C).
- Gupta, Sanjib Kumar & Chattopadhyay, Gaurangadeb, 2022. "Early detection of reliability related problems from two-dimensional warranty data considering labour code priority index," Reliability Engineering and System Safety, Elsevier, vol. 225(C).
- Cai, Xia & Tian, Yubin & Ning, Wei, 2019. "Change-point analysis of the failure mechanisms based on accelerated life tests," Reliability Engineering and System Safety, Elsevier, vol. 188(C), pages 515-522.
- Liu, Di & Wang, Shaoping, 2021. "An artificial neural network supported stochastic process for degradation modeling and prediction," Reliability Engineering and System Safety, Elsevier, vol. 214(C).
- Alessandra R. Brazzale & Helmut Küchenhoff & Stefanie Krügel & Tobias S. Schiergens & Heiko Trentzsch & Wolfgang Hartl, 2019. "Nonparametric change point estimation for survival distributions with a partially constant hazard rate," Lifetime Data Analysis: An International Journal Devoted to Statistical Methods and Applications for Time-to-Event Data, Springer, vol. 25(2), pages 301-321, April.
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Keywords
Warranty forecasting; Field return data; Change point problem; Electronics reliability;All these keywords.
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