Statistical Process Control using Shewhart Control Charts with Supplementary Runs Rules
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DOI: 10.1007/s11009-007-9016-8
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References listed on IDEAS
- Markos V. Koutras & Sotirios Bersimis & Demetrios L. Antzoulakos, 2006. "Improving the Performance of the Chi-square Control Chart via Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 8(3), pages 409-426, September.
- Fu, James C. & Spiring, Fred A. & Xie, Hansheng, 2002. "On the average run lengths of quality control schemes using a Markov chain approach," Statistics & Probability Letters, Elsevier, vol. 56(4), pages 369-380, February.
- C. Fu, James & Shmueli, Galit & Chang, Y. M., 2003. "A unified Markov chain approach for computing the run length distribution in control charts with simple or compound rules," Statistics & Probability Letters, Elsevier, vol. 65(4), pages 457-466, December.
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Cited by:
- Demetrios Antzoulakos & Athanasios Rakitzis, 2010. "Runs rules schemes for monitoring process variability," Journal of Applied Statistics, Taylor & Francis Journals, vol. 37(7), pages 1231-1247.
- Sotiris Bersimis & Kostas Triantafyllopoulos, 2020. "Dynamic Non-parametric Monitoring of Air-Pollution," Methodology and Computing in Applied Probability, Springer, vol. 22(4), pages 1457-1479, December.
- Tung-Lung Wu, 2020. "Conditional waiting time distributions of runs and patterns and their applications," Annals of the Institute of Statistical Mathematics, Springer;The Institute of Statistical Mathematics, vol. 72(2), pages 531-543, April.
- Hsing-Ming Chang & James C. Fu, 2022. "On Distribution and Average Run Length of a Two-Stage Control Process," Methodology and Computing in Applied Probability, Springer, vol. 24(4), pages 2723-2742, December.
- Sotiris Bersimis & Markos V. Koutras & George K. Papadopoulos, 2014. "Waiting Time for an Almost Perfect Run and Applications in Statistical Process Control," Methodology and Computing in Applied Probability, Springer, vol. 16(1), pages 207-222, March.
- Chang, Hsing-Ming & Chang, Yung-Ming & Fu, Winnie H.W. & Lee, Wan-Chen, 2018. "On limiting theorems for conditional causation probabilities of multiple-run-rules," Statistics & Probability Letters, Elsevier, vol. 138(C), pages 151-156.
- Sánchez, Ismael, 2015. "Adaptive EWMA Control Charts with a Time Varying Smoothing Parameter," DES - Working Papers. Statistics and Econometrics. WS ws1507, Universidad Carlos III de Madrid. Departamento de EstadÃstica.
- Sotirios Bersimis & Athanasios Sachlas & Philippe Castagliola, 2017. "Controlling Bivariate Categorical Processes using Scan Rules," Methodology and Computing in Applied Probability, Springer, vol. 19(4), pages 1135-1149, December.
- Serkan Eryilmaz, 2018. "Stochastic Ordering Among Success Runs Statistics in a Sequence of Exchangeable Binary Trials," Methodology and Computing in Applied Probability, Springer, vol. 20(2), pages 563-573, June.
- Sotirios Bersimis & Athanasios Sachlas & Ross Sparks, 2017. "Performance Monitoring and Competence Assessment in Health Services," Methodology and Computing in Applied Probability, Springer, vol. 19(4), pages 1169-1190, December.
- F. Jamaluddin* & H. H. Ali & S. S. Syed Yahaya & Z. Zain, 2018. "The Performance of Robust Multivariate Ewma Control Charts," The Journal of Social Sciences Research, Academic Research Publishing Group, pages 52-58:6.
- Athanasios C. Rakitzis & Demetrios L. Antzoulakos, 2011. "Chi-square Control Charts with Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 13(4), pages 657-669, December.
- Jungtaek Oh & Christian H. Weiß, 2020. "On the Individuals Chart with Supplementary Runs Rules under Serial Dependence," Methodology and Computing in Applied Probability, Springer, vol. 22(3), pages 1257-1273, September.
- Athanasios Rakitzis & Demetrios Antzoulakos, 2015. "Start-up demonstration tests with three-level classification," Statistical Papers, Springer, vol. 56(1), pages 1-21, February.
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Keywords
Statistical process control; Control charts; Shewhart; Runs rules; Scans rules; Patterns; Markov chain; Average run length;All these keywords.
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