Waiting Time for an Almost Perfect Run and Applications in Statistical Process Control
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DOI: 10.1007/s11009-012-9307-6
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References listed on IDEAS
- Markos V. Koutras & Sotirios Bersimis & Demetrios L. Antzoulakos, 2006. "Improving the Performance of the Chi-square Control Chart via Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 8(3), pages 409-426, September.
- Chang, C. J. & Fann, C. S. J. & Chou, W. C. & Lian, I. B., 2003. "On the tail probability of the longest well-matching run," Statistics & Probability Letters, Elsevier, vol. 63(3), pages 267-274, July.
- Athanasios C. Rakitzis & Demetrios L. Antzoulakos, 2011. "Chi-square Control Charts with Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 13(4), pages 657-669, December.
- Han, Qing & Hirano, Katuomi, 2003. "Waiting time problem for an almost perfect match," Statistics & Probability Letters, Elsevier, vol. 65(1), pages 39-49, October.
- M. V. Koutras & S. Bersimis & P. E. Maravelakis, 2007. "Statistical Process Control using Shewhart Control Charts with Supplementary Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 9(2), pages 207-224, June.
- Bersimis, Sotiris & Psarakis, Stelios & Panaretos, John, 2006. "Multivariate Statistical Process Control Charts: An Overview," MPRA Paper 6399, University Library of Munich, Germany.
- Galit Shmueli, 2002. "System-Wide Probabilities for Systems with Runs and Scans Rules," Methodology and Computing in Applied Probability, Springer, vol. 4(4), pages 409-419, December.
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Cited by:
- Spiros D. Dafnis & Frosso S. Makri, 2022. "Weak runs in sequences of binary trials," Metrika: International Journal for Theoretical and Applied Statistics, Springer, vol. 85(5), pages 573-603, July.
- Hsing-Ming Chang & James C. Fu, 2022. "On Distribution and Average Run Length of a Two-Stage Control Process," Methodology and Computing in Applied Probability, Springer, vol. 24(4), pages 2723-2742, December.
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Keywords
Almost perfect run; Scans; Runs; Markov chain embeddable random variables; Runs rules; Average run length; Statistical process control;All these keywords.
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