Runs rules schemes for monitoring process variability
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DOI: 10.1080/02664760903002683
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- M. V. Koutras & S. Bersimis & P. E. Maravelakis, 2007. "Statistical Process Control using Shewhart Control Charts with Supplementary Runs Rules," Methodology and Computing in Applied Probability, Springer, vol. 9(2), pages 207-224, June.
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Cited by:
- Sotirios Bersimis & Athanasios Sachlas & Philippe Castagliola, 2017. "Controlling Bivariate Categorical Processes using Scan Rules," Methodology and Computing in Applied Probability, Springer, vol. 19(4), pages 1135-1149, December.
- Jungtaek Oh & Christian H. Weiß, 2020. "On the Individuals Chart with Supplementary Runs Rules under Serial Dependence," Methodology and Computing in Applied Probability, Springer, vol. 22(3), pages 1257-1273, September.
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Keywords
average run length; markov chain embedding technique; optimization; runs rules; Shewhart control charts; standard deviation;All these keywords.
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