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An Exponential Nonuniform Berry–Esseen Bound for the Fractional Ornstein–Uhlenbeck Process

Author

Listed:
  • Hui Jiang

    (Nanjing University of Aeronautics and Astronautics)

  • Jingying Zhou

    (Nanjing University of Aeronautics and Astronautics)

Abstract

In this paper, we study the asymptotic properties of the maximum likelihood estimator of the drift parameter in the fractional Ornstein–Uhlenbeck process. Using the change of measure method and asymptotic analysis technique, we establish an exponential nonuniform Berry–Esseen bound for the maximum likelihood estimator. As an application, the optimal uniform Berry–Esseen bound and Cramér-type moderate deviation are obtained.

Suggested Citation

  • Hui Jiang & Jingying Zhou, 2023. "An Exponential Nonuniform Berry–Esseen Bound for the Fractional Ornstein–Uhlenbeck Process," Journal of Theoretical Probability, Springer, vol. 36(2), pages 1037-1058, June.
    • Handle: RePEc:spr:jotpro:v:36:y:2023:i:2:d:10.1007_s10959-022-01194-w
    DOI: 10.1007/s10959-022-01194-w
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    References listed on IDEAS

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