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Deep generative model with time series-image encoding for manufacturing fault detection in die casting process

Author

Listed:
  • Jiyoung Song

    (Korea Institute of Industrial Technology)

  • Young Chul Lee

    (Korea Institute of Industrial Technology)

  • Jeongsu Lee

    (Gachon University)

Abstract

The increasing demand for advanced fault detection in manufacturing processes has encouraged the application of industrial intelligence based on deep learning. However, implementing deep learning technology at actual manufacturing sites remains challenging because the data acquired during the manufacturing process are not only unlabeled but also imbalanced time series data. In this study, we constructed semi-supervised manufacturing fault detection methods to deal with the imbalanced time series data obtained from manufacturing applications, based on recently proposed deep generative models: variational autoencoder-reconstruction along projection pathway (VAE-RaPP) and Fence generative adversarial network (Fence GAN). To apply a semi-supervised learning algorithm, 1000 labeled samples of good product were prepared. The deep generative models learned the features of good product from these labeled samples during training. Consequently, the model was sufficiently trained to distinguish good and defective product in unlabeled samples. Additionally, we converted the time series data acquired during the manufacturing process into images to improve the feature extraction capability of deep neural networks based on three encoding methods: Gramian angular difference field (GADF), Markov transition field (MTF), and recurrence plot (RP). The performance of these methods was then compared using four evaluation indicators: area under the receiver operating characteristic (AUROC), average precision (AP) score, precision-recall (PR) curve, and accuracy. The VAE-RaPP exhibited outstanding performance in all types of encoding methods when compared with the Fence GAN. This research provides a novel approach that combines the encoding of time series into images and deep generative models for manufacturing fault detection.

Suggested Citation

  • Jiyoung Song & Young Chul Lee & Jeongsu Lee, 2023. "Deep generative model with time series-image encoding for manufacturing fault detection in die casting process," Journal of Intelligent Manufacturing, Springer, vol. 34(7), pages 3001-3014, October.
  • Handle: RePEc:spr:joinma:v:34:y:2023:i:7:d:10.1007_s10845-022-01981-6
    DOI: 10.1007/s10845-022-01981-6
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    References listed on IDEAS

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    1. Takaya Saito & Marc Rehmsmeier, 2015. "The Precision-Recall Plot Is More Informative than the ROC Plot When Evaluating Binary Classifiers on Imbalanced Datasets," PLOS ONE, Public Library of Science, vol. 10(3), pages 1-21, March.
    2. Seokho Kang, 2020. "Joint modeling of classification and regression for improving faulty wafer detection in semiconductor manufacturing," Journal of Intelligent Manufacturing, Springer, vol. 31(2), pages 319-326, February.
    3. Sebastian Larsen & Paul A. Hooper, 2022. "Deep semi-supervised learning of dynamics for anomaly detection in laser powder bed fusion," Journal of Intelligent Manufacturing, Springer, vol. 33(2), pages 457-471, February.
    4. Maciej Grzenda & Andres Bustillo, 2019. "Semi-supervised roughness prediction with partly unlabeled vibration data streams," Journal of Intelligent Manufacturing, Springer, vol. 30(2), pages 933-945, February.
    5. Jialin Li & Xueyi Li & David He & Yongzhi Qu, 2020. "Unsupervised rotating machinery fault diagnosis method based on integrated SAE–DBN and a binary processor," Journal of Intelligent Manufacturing, Springer, vol. 31(8), pages 1899-1916, December.
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    Cited by:

    1. Jiayang Liu & Fuqi Xie & Qiang Zhang & Qiucheng Lyu & Xiaosun Wang & Shijing Wu, 2024. "A multisensory time-frequency features fusion method for rotating machinery fault diagnosis under nonstationary case," Journal of Intelligent Manufacturing, Springer, vol. 35(7), pages 3197-3217, October.

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