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Network characteristics and patent value—Evidence from the Light-Emitting Diode industry

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  • Way-Ren Huang
  • Chia-Jen Hsieh
  • Ke-Chiun Chang
  • Yen-Jo Kiang
  • Chien-Chung Yuan
  • Woei-Chyn Chu

Abstract

This study proposes a different angle to social network analysis that evaluates patent value and explores its influencing factors using the network centrality and network position. This study utilizes a logistic regression model to explore the relationships in the LED industry between patent value and network centrality as measured from out-degree centrality, in-degree centrality, in-closeness centrality, and network position, which is measured from effect size. The empirical result shows that out-degree centrality and in-degree centrality have significant positive effects on patent value and that effect size has a significant negative effect on patent value.

Suggested Citation

  • Way-Ren Huang & Chia-Jen Hsieh & Ke-Chiun Chang & Yen-Jo Kiang & Chien-Chung Yuan & Woei-Chyn Chu, 2017. "Network characteristics and patent value—Evidence from the Light-Emitting Diode industry," PLOS ONE, Public Library of Science, vol. 12(8), pages 1-14, August.
    • Handle: RePEc:plo:pone00:0181988
    DOI: 10.1371/journal.pone.0181988
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