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Sequential Inspection Under Capacity Constraints

Author

Listed:
  • David D. Yao

    (Columbia University, New York, New York)

  • Shaohui Zheng

    (Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)

Abstract

We study the inspection process in the context of multistage batch manufacturing, focusing on interstage coordination under capacity limits. The problem is formulated as a constrained Markov decision program. We establish the optimality of a sequential policy that is characterized by a sequence of thresholds, with certain randomization at the thresholds. We further show that such an optimal policy can be completely derived through solving a linear program, and that randomization is needed at no more than two threshold values. We discuss an application in semiconductor wafer fabrication, which motivates our study.

Suggested Citation

  • David D. Yao & Shaohui Zheng, 1999. "Sequential Inspection Under Capacity Constraints," Operations Research, INFORMS, vol. 47(3), pages 410-421, June.
    • Handle: RePEc:inm:oropre:v:47:y:1999:i:3:p:410-421
    DOI: 10.1287/opre.47.3.410
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    References listed on IDEAS

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    1. Jihong Ou & Lawrence M. Wein, 1996. "Sequential Screening in Semiconductor Manufacturing, II: Exploiting Lot-to-Lot Variability," Operations Research, INFORMS, vol. 44(1), pages 196-205, February.
    2. Hong Chen & J. Michael Harrison & Avi Mandelbaum & Ann Van Ackere & Lawrence M. Wein, 1988. "Empirical Evaluation of a Queueing Network Model for Semiconductor Wafer Fabrication," Operations Research, INFORMS, vol. 36(2), pages 202-215, April.
    3. Mark D. Longtin & Lawrence M. Wein & Roy E. Welsch, 1996. "Sequential Screening in Semiconductor Manufacturing, I: Exploiting Spatial Dependence," Operations Research, INFORMS, vol. 44(1), pages 173-195, February.
    4. Jinfa Chen & David D. Yao & Shaohui Zheng, 1998. "Quality Control for Products Supplied with Warranty," Operations Research, INFORMS, vol. 46(1), pages 107-115, February.
    5. Susan L. Albin & David J. Friedman, 1989. "The Impact of Clustered Defect Distributions in IC Fabrication," Management Science, INFORMS, vol. 35(9), pages 1066-1078, September.
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    Cited by:

    1. Wooseung Jang & J. George Shanthikumar, 2002. "Stochastic allocation of inspection capacity to competitive processes," Naval Research Logistics (NRL), John Wiley & Sons, vol. 49(1), pages 78-94, February.

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