Hierarchical Transfer Learning for Cycle Time Forecasting for Semiconductor Wafer Lot under Different Work in Process Levels
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- Chuwen Zhang & Jonathan F. Bard & Rodolfo Chacon, 2017. "Controlling work in process during semiconductor assembly and test operations," International Journal of Production Research, Taylor & Francis Journals, vol. 55(24), pages 7251-7275, December.
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Keywords
wafer fabrication; cycle time; time series prediction; work in process; convolutional neural network; hierarchical optimization; transfer learning;All these keywords.
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