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Selected Problems of Power MOSFETs Thermal Parameters Measurements

Author

Listed:
  • Krzysztof Górecki

    (Department of Marine Electronics, Gdynia Maritime University, 81-225 Gdynia, Poland)

  • Krzysztof Posobkiewicz

    (Department of Marine Electronics, Gdynia Maritime University, 81-225 Gdynia, Poland)

Abstract

In the paper, selected problems that are related to the measurements of thermal parameters of power MOSFETs that are placed on a common heat sink are analysed. The application of the indirect electrical method, the contact method, and the optical method in measuring self and mutual transient thermal impedances of these transistors is presented. The circuits that are required to perform measurements are presented and described. The errors of measurements are assessed for each of the considered methods. In the case of the indirect electrical method, an additional influence of the selection of a thermo-sensitive parameter and the function approximating thermometric characteristics on the measurement error are taken into consideration. The measurement results of the thermal parameters of the investigated transistors that were obtained using the considered measurement methods in various supply conditions are presented and discussed.

Suggested Citation

  • Krzysztof Górecki & Krzysztof Posobkiewicz, 2021. "Selected Problems of Power MOSFETs Thermal Parameters Measurements," Energies, MDPI, vol. 14(24), pages 1-22, December.
    • Handle: RePEc:gam:jeners:v:14:y:2021:i:24:p:8353-:d:700172
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    References listed on IDEAS

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    1. Vincenzo d’Alessandro & Lorenzo Codecasa & Antonio Pio Catalano & Ciro Scognamillo, 2020. "Circuit-Based Electrothermal Simulation of Multicellular SiC Power MOSFETs Using FANTASTIC," Energies, MDPI, vol. 13(17), pages 1-27, September.
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    Cited by:

    1. Shuo Wu & Pengju Sun & Xu Huang & Kaiwei Li, 2023. "A Bridge-Level Junction Temperature Estimation Method for SiC MOSFETs Combining Transient Voltage and Current Peaks," Energies, MDPI, vol. 16(10), pages 1-12, May.
    2. Krzysztof Górecki & Krzysztof Posobkiewicz, 2022. "Influence of a Cooling System on Power MOSFETs’ Thermal Parameters," Energies, MDPI, vol. 15(8), pages 1-20, April.
    3. Krzysztof Górecki & Krzysztof Posobkiewicz, 2022. "Cooling Systems of Power Semiconductor Devices—A Review," Energies, MDPI, vol. 15(13), pages 1-29, June.

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