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An accelerated test method of luminous flux depreciation for LED luminaires and lamps

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  • Qian, C.
  • Fan, X.J.
  • Fan, J.J.
  • Yuan, C.A.
  • Zhang, G.Q.

Abstract

Light Emitting Diode (LED) luminaires and lamps are energy-saving and environmental friendly alternatives to traditional lighting products. However, current luminous flux depreciation test at luminaire and lamp level requires a minimum of 6000h testing, which is even longer than the product development cycle time. This paper develops an accelerated test method for luminous flux depreciation to reduce the test time within 2000h at an elevated temperature. The method is based on lumen maintenance boundary curve, obtained from a collection of LED source lumen depreciation data, known as LM-80 data. The exponential decay model and Arrhenius acceleration relationship are used to determine the new threshold of lumen maintenance and acceleration factor. The proposed method has been verified by a number of simulation studies and experimental data for a wide range of LED luminaire and lamp types from both internal and external experiments. The qualification results obtained by the accelerated test method agree well with traditional 6000h tests.

Suggested Citation

  • Qian, C. & Fan, X.J. & Fan, J.J. & Yuan, C.A. & Zhang, G.Q., 2016. "An accelerated test method of luminous flux depreciation for LED luminaires and lamps," Reliability Engineering and System Safety, Elsevier, vol. 147(C), pages 84-92.
    • Handle: RePEc:eee:reensy:v:147:y:2016:i:c:p:84-92
    DOI: 10.1016/j.ress.2015.11.009
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    References listed on IDEAS

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    1. Han, David, 2015. "Time and cost constrained optimal designs of constant-stress and step-stress accelerated life tests," Reliability Engineering and System Safety, Elsevier, vol. 140(C), pages 1-14.
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    3. Fan, Jiajie & Yung, Kam-Chuen & Pecht, Michael, 2014. "Prognostics of lumen maintenance for High power white light emitting diodes using a nonlinear filter-based approach," Reliability Engineering and System Safety, Elsevier, vol. 123(C), pages 63-72.
    4. Oh, Hyunseok & Choi, Seunghyuk & Kim, Keunsu & Youn, Byeng D. & Pecht, Michael, 2015. "An empirical model to describe performance degradation for warranty abuse detection in portable electronics," Reliability Engineering and System Safety, Elsevier, vol. 142(C), pages 92-99.
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    Cited by:

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    2. Ikuzwe, Alice & Ye, Xianming & Xia, Xiaohua, 2020. "Energy-maintenance optimization for retrofitted lighting system incorporating luminous flux degradation to enhance visual comfort," Applied Energy, Elsevier, vol. 261(C).
    3. Lu, Yaohui & Zheng, Heyan & Zeng, Jing & Chen, Tianli & Wu, Pingbo, 2019. "Fatigue life reliability evaluation in a high-speed train bogie frame using accelerated life and numerical test," Reliability Engineering and System Safety, Elsevier, vol. 188(C), pages 221-232.
    4. Sun, Bo & Fan, Xuejun & van Driel, Willem & Cui, Chengqiang & Zhang, Guoqi, 2018. "A stochastic process based reliability prediction method for LED driver," Reliability Engineering and System Safety, Elsevier, vol. 178(C), pages 140-146.

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