Optimal acceptance sampling plans for log-location–scale lifetime models using average risks
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DOI: 10.1016/j.csda.2011.09.020
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- Fernández, Arturo J., 2012. "Minimizing the area of a Pareto confidence region," European Journal of Operational Research, Elsevier, vol. 221(1), pages 205-212.
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Keywords
Reliability sampling plans; Acceptable and rejectable quality levels; Average producer and consumer risks; Weibull and lognormal distributions; Failure censoring;All these keywords.
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