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Stochasticity in ferroelectric memory devices with different bottom electrode crystallinity

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  • Koo, Ryun-Han
  • Shin, Wonjun
  • Jung, Gyuweon
  • Kwon, Dongseok
  • Kim, Jae-Joon
  • Kwon, Daewoong
  • Lee, Jong-Ho

Abstract

This study comprehensively analyzes of the influence of bottom electrode crystallinity on the stochastic noise in ferroelectric tunnel junctions (FTJs). We perform a comparative analysis of stochastic read noise in FTJ devices with crystalline silicon (FTJc-Si) and poly-silicon (FTJpoly-Si) bottom electrodes by utilizing low-frequency noise spectroscopy and multi-frequency conductance measurements. The results indicate that FTJpoly-Si exhibits a 50 % higher read current fluctuation in the high-resistance state (HRS) at high read currents compared to FTJc-Si due to differences in interface trap density and the subsequent barrier height fluctuations. Although the crystallinity of the bottom electrode affects the noise in the HRS, the noise in the low-resistance state (LRS) remains consistent with the consequence of bulk-limited Poole-Frenkel emission. These findings clarify the relationship between bottom electrode crystallinity and stochastic noise in FTJs, providing crucial insights for the design and operation of future ferroelectric-based memory.

Suggested Citation

  • Koo, Ryun-Han & Shin, Wonjun & Jung, Gyuweon & Kwon, Dongseok & Kim, Jae-Joon & Kwon, Daewoong & Lee, Jong-Ho, 2024. "Stochasticity in ferroelectric memory devices with different bottom electrode crystallinity," Chaos, Solitons & Fractals, Elsevier, vol. 183(C).
    • Handle: RePEc:eee:chsofr:v:183:y:2024:i:c:s0960077924004132
    DOI: 10.1016/j.chaos.2024.114861
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    References listed on IDEAS

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    1. Maldonado, D. & Aguilera-Pedregosa, C. & Vinuesa, G. & García, H. & Dueñas, S. & Castán, H. & Aldana, S. & González, M.B. & Moreno, E. & Jiménez-Molinos, F. & Campabadal, F. & Roldán, J.B., 2022. "An experimental and simulation study of the role of thermal effects on variability in TiN/Ti/HfO2/W resistive switching nonlinear devices," Chaos, Solitons & Fractals, Elsevier, vol. 160(C).
    2. Vincent Garcia & Manuel Bibes, 2014. "Ferroelectric tunnel junctions for information storage and processing," Nature Communications, Nature, vol. 5(1), pages 1-12, September.
    3. Vasileiadis, Nikolaos & Loukas, Panagiotis & Karakolis, Panagiotis & Ioannou-Sougleridis, Vassilios & Normand, Pascal & Ntinas, Vasileios & Fyrigos, Iosif-Angelos & Karafyllidis, Ioannis & Sirakoulis,, 2021. "Multi-level resistance switching and random telegraph noise analysis of nitride based memristors," Chaos, Solitons & Fractals, Elsevier, vol. 153(P1).
    4. Mahata, Chandreswar & Kim, Sungjun, 2021. "Electrical and optical artificial synapses properties of TiN-nanoparticles incorporated HfAlO-alloy based memristor," Chaos, Solitons & Fractals, Elsevier, vol. 153(P1).
    5. Stavrinides, Stavros G. & Hanias, Michael P. & Gonzalez, Mireia B. & Campabadal, Francesca & Contoyiannis, Yiannis & Potirakis, Stelios M. & Al Chawa, Mohamad Moner & de Benito, Carol & Tetzlaff, Rona, 2022. "On the chaotic nature of random telegraph noise in unipolar RRAM memristor devices," Chaos, Solitons & Fractals, Elsevier, vol. 160(C).
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