Patent Similarity Data and Innovation Metrics
Author
Abstract
Suggested Citation
DOI: 10.1111/jels.12261
Download full text from publisher
Citations
Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
Cited by:
- Natalie A. Carlson, 2023. "Differentiation in microenterprises," Strategic Management Journal, Wiley Blackwell, vol. 44(5), pages 1141-1167, May.
- A‐Sung Hong, 2024. "Beyond the finish line: How losing in patent race drives post‐race innovation," Strategic Management Journal, Wiley Blackwell, vol. 45(5), pages 968-993, May.
- Kong, Nancy & Dulleck, Uwe & Jaffe, Adam B. & Sun, Shupeng & Vajjala, Sowmya, 2023.
"Linguistic metrics for patent disclosure: Evidence from university versus corporate patents,"
Research Policy, Elsevier, vol. 52(2).
- Nancy Kong & Uwe Dulleck & Adam Jaffe & Shupeng Sun & Sowmya Vajjala, 2020. "Linguistic Metrics for Patent Disclosure: Evidence from University versus Corporate Patents," CESifo Working Paper Series 8571, CESifo.
- Nancy Kong & Uwe Dulleck & Adam B. Jaffe & Shupeng Sun & Sowmya Vajjala, 2020. "Linguistic Metrics for Patent Disclosure: Evidence from University Versus Corporate Patents," NBER Working Papers 27803, National Bureau of Economic Research, Inc.
- de Rassenfosse, Gaétan & Pellegrino, Gabriele & Raiteri, Emilio, 2024.
"Do patents enable disclosure? Evidence from the invention secrecy act,"
International Journal of Industrial Organization, Elsevier, vol. 92(C).
- Gaetan de Rassenfosse & Gabriele Pellegrino & Emilio Raiteri, 2020. "Do Patents Enable Disclosure? Evidence from the Invention Secrecy Act," Working Papers 9, Chair of Science, Technology, and Innovation Policy.
- Gaetan de Rassenfosse & Gabriele Pellegrino & Emilio Raiteri, 2023. "Do Patents Enable Disclosure? Evidence from the Invention Secrecy Act," Working Papers 26, Chair of Science, Technology, and Innovation Policy.
- Meijun Liu & Sijie Yang & Yi Bu & Ning Zhang, 2023. "Female early-career scientists have conducted less interdisciplinary research in the past six decades: evidence from doctoral theses," Palgrave Communications, Palgrave Macmillan, vol. 10(1), pages 1-16, December.
- Higham, Kyle & de Rassenfosse, Gaétan & Jaffe, Adam B., 2021.
"Patent Quality: Towards a Systematic Framework for Analysis and Measurement,"
Research Policy, Elsevier, vol. 50(4).
- Kyle W. Higham & Gaétan de Rassenfosse & Adam B. Jaffe, 2020. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," NBER Working Papers 27598, National Bureau of Economic Research, Inc.
- Higham, Kyle & de Rassenfosse, Gaetan & Jaffe, Adam B, 2020. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," SocArXiv 49qxk, Center for Open Science.
- Kyle Higham & Gaetan de Rassenfosse & Adam Jaffe, 2021. "Patent quality: Towards a Systematic Framework for Analysis and Measurement," Working Papers 14, Chair of Science, Technology, and Innovation Policy.
- Lorenz Brachtendorf & Fabian Gaessler & Dietmar Harhoff, 2023. "Truly standard‐essential patents? A semantics‐based analysis," Journal of Economics & Management Strategy, Wiley Blackwell, vol. 32(1), pages 132-157, January.
- Hain, Daniel S. & Jurowetzki, Roman & Buchmann, Tobias & Wolf, Patrick, 2022. "A text-embedding-based approach to measuring patent-to-patent technological similarity," Technological Forecasting and Social Change, Elsevier, vol. 177(C).
- Teng, Hao & Wang, Nan & Zhao, Hongyu & Hu, Yingtong & Jin, Haitao, 2024. "Enhancing semantic text similarity with functional semantic knowledge (FOP) in patents," Journal of Informetrics, Elsevier, vol. 18(1).
- Ashtor, Jonathan H., 2022. "Modeling patent clarity," Research Policy, Elsevier, vol. 51(2).
- Guangtong Li & L. Siddharth & Jianxi Luo, 2023. "Embedding knowledge graph of patent metadata to measure knowledge proximity," Journal of the Association for Information Science & Technology, Association for Information Science & Technology, vol. 74(4), pages 476-490, April.
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wly:empleg:v:17:y:2020:i:3:p:615-639. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
We have no bibliographic references for this item. You can help adding them by using this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Wiley Content Delivery (email available below). General contact details of provider: https://doi.org/10.1111/(ISSN)1740-1461 .
Please note that corrections may take a couple of weeks to filter through the various RePEc services.